- 专利标题: Radiation detector and a method for forming a semiconductor device
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申请号: US15581549申请日: 2017-04-28
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公开(公告)号: US10199526B2公开(公告)日: 2019-02-05
- 发明人: Hans-Joachim Schulze , Johannes Hacker
- 申请人: Infineon Technologies AG
- 申请人地址: DE Neubiberg
- 专利权人: Infineon Technologies AG
- 当前专利权人: Infineon Technologies AG
- 当前专利权人地址: DE Neubiberg
- 代理机构: Murphy, Bilak & Homiller, PLLC
- 主分类号: H01L31/115
- IPC分类号: H01L31/115 ; H01L21/02 ; H01L31/18 ; H01L31/0352 ; H01L31/0288 ; H01L31/0224
摘要:
A method for forming a semiconductor device includes forming an amorphous semiconductor layer adjacent to a lightly doped region of a semiconductor wafer. The lightly doped region forms at least part of a back side of the semiconductor wafer, and the lightly doped region has a first conductivity type. The method further includes incorporating dopants into the amorphous semiconductor layer during or after forming the amorphous semiconductor layer. The method further includes annealing the amorphous semiconductor layer to transform at least a part of the amorphous semiconductor layer into a substantially monocrystalline semiconductor layer and to form a highly doped region in the monocrystalline semiconductor layer at the back side of the semiconductor wafer. The highly doped region has the first conductivity type.
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