- 专利标题: Sample test method, microfluidic device, and test device
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申请号: US15891632申请日: 2018-02-08
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公开(公告)号: US10126232B2公开(公告)日: 2018-11-13
- 发明人: Sung Ha Park , Sang Bum Park , Beom Seok Lee , Kui Hyun Kim , Joo Hee Park , Kyung Mi Song , Euy Hyun Cho , Ha Na Kim
- 申请人: SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 代理机构: Sughrue Mion, PLLC
- 优先权: KR10-2014-0104285 20140812; KR10-2014-0194091 20141230
- 主分类号: G01N21/31
- IPC分类号: G01N21/31 ; G01N21/05 ; G01N21/27 ; G01N21/01 ; G01N33/49 ; G01N33/08 ; G01N35/08 ; B01L3/00
摘要:
A sample test method, microfluidic device, and test device efficiently and accurately compensates for interference of an interfering substance present in a sample using optical measurement without addition of a separate reagent for detecting the interfering substance. The sample test method includes: measuring an optical characteristic value of a target substance present in a sample; measuring an optical characteristic value of an interfering substance present in the sample; and determining a concentration of the target substance for which interference of the interfering substance is compensated for based on the optical characteristic value of the interfering substance.
公开/授权文献
- US20180180536A1 SAMPLE TEST METHOD, MICROFLUIDIC DEVICE, AND TEST DEVICE 公开/授权日:2018-06-28
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