- 专利标题: Methods of fabricating three-dimensional semiconductor devices
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申请号: US15642829申请日: 2017-07-06
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公开(公告)号: US10096618B2公开(公告)日: 2018-10-09
- 发明人: Ki-Woong Kim , Hyo-Jung Kim , Kieun Seo , Ki Hoon Jang , Byoungho Kwon , Boun Yoon
- 申请人: Ki-Woong Kim , Hyo-Jung Kim , Kieun Seo , Ki Hoon Jang , Byoungho Kwon , Boun Yoon
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Ward and Smith, P.A.
- 优先权: KR10-2016-0122389 20160923
- 主分类号: H01L21/3205
- IPC分类号: H01L21/3205 ; H01L27/11582 ; H01L21/283 ; H01L21/3105 ; H01L27/1157 ; H01L27/11573 ; H01L21/02 ; H01L27/24
摘要:
A method of fabricating a three-dimensional semiconductor device is provided. The method includes providing a substrate with a peripheral circuit region and a cell array region; forming a peripheral structure on the peripheral circuit region, and forming an electrode structure on the cell array region. The electrode structure includes a lower electrode, a lower insulating planarized layer on the lower electrode, and upper electrodes and upper insulating layers vertically and alternatingly stacked on the lower insulating planarized layer, and the lower insulating planarized layer may be extended to cover the peripheral structure on the peripheral circuit region. An upper insulating planarized layer is formed to cover the electrode structure and the lower insulating planarized layer on the peripheral circuit region.
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