发明授权
- 专利标题: Repair circuit, semiconductor apparatus and semiconductor system using the same
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申请号: US15048226申请日: 2016-02-19
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公开(公告)号: US10074444B2公开(公告)日: 2018-09-11
- 发明人: Young Hyun Baek
- 申请人: SK hynix Inc.
- 申请人地址: KR Icheon-si, Gyeonggi-do
- 专利权人: SK hynix Inc.
- 当前专利权人: SK hynix Inc.
- 当前专利权人地址: KR Icheon-si, Gyeonggi-do
- 代理机构: William Park & Associates Ltd.
- 优先权: KR10-2015-0132597 20150918
- 主分类号: G11C29/44
- IPC分类号: G11C29/44 ; G11C29/00
摘要:
A repair circuit may be provided. The repair circuit may include a latch array including a plurality of latch sets. The repair circuit may include a fuse array including a plurality of fuse sets, and configured to be written, in each fuse set, with repair address data and latch address data which defines a position of a latch set where the repair address data is to be stored, among the plurality of latch sets. The repair circuit may include a first decoder configured to cause data written in any one fuse set among the plurality of fuse sets to be outputted, and a second decoder configured to cause the repair address data to be stored in the latch set corresponding to the latch address data among the plurality of latch sets.
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