- 专利标题: Self-forming spacers using oxidation
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申请号: US15604719申请日: 2017-05-25
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公开(公告)号: US10068967B2公开(公告)日: 2018-09-04
- 发明人: Kevin K. Chan , Masaharu Kobayashi , Effendi Leobandung
- 申请人: International Business Machines Corporation
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理商 L. Jeffrey Kelly
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L29/66 ; H01L29/78 ; H01L21/38 ; H01L21/34 ; H01L21/02 ; H01L21/311 ; H01L21/321
摘要:
A method of forming a self-forming spacer using oxidation. The self-forming spacer may include forming a fin field effect transistor on a substrate, the fin field effect transistor includes a gate on a fin, the gate is perpendicular to the fin; forming a gate spacer on the gate and a fin spacer on the fin, the gate spacer and the fin spacer are formed in a single step by oxidizing an exposed surface of the gate and an exposed surface of the fin; and removing the fin spacer from the fin.
公开/授权文献
- US20170263702A1 SELF-FORMING SPACERS USING OXIDATION 公开/授权日:2017-09-14
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