The invention provides a probe board for semiconductor chip detection which can detect whether the semiconductor chip is qualified accurately, as the elastic probe part will not be bent or broken. The probe board of the invention is provided with an upper main board consisting of a strengthening fixing board and a printed circuit board PCB, probe device supporters fixed under the upper main boardwith a certain space and arranged with probe devices, a housing coupled with the upper main board via a screw for supporting the probe device supporters, and a supporting table connected via screws under the housing to form a profile. An electrifying part of the probe device is connected with a PCB electrifying hole which forms a circuit with a channel connected with the printed circuit, and an electric signal from the probe part at the lower part of the probe device transmits a signal indicating whether the checked body has an open circuit via an electrifying circuit consisting of the electrifying part, the PCB electrifying hole and a connecting port of the main board.