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发明授权
CN105811935B 基于动态输入向量的片上SET脉冲测试方法 有权

基于动态输入向量的片上SET脉冲测试方法
摘要：
本发明公开了基于动态输入向量的片上SET脉冲测试方法，目的是提供一种与电路实际工作环境更为接近的片上SET脉冲测试方法。技术方案是：1.设计基于动态输入向量的片上SET脉冲测试电路；2.对基于动态输入向量的片上SET脉冲测试电路上电，在反相器链的输入端加载一个动态输入向量；3.将基于动态输入向量的片上SET脉冲测试电路置于粒子辐射环境中，测试SET脉冲，最终在外部主机端口得到动态输入向量下电路产生的SET脉冲。本发明相比于现有片上SET脉冲测试方法，测得的SET脉冲个数、每个SET脉冲的宽度以及SET脉冲的平均宽度等与电路在实际工作过程中受到单粒子轰击时所产生的SET脉冲更为接近，从而使得测试结果更具指导意义，降低集成电路软错误率分析的难度。
摘要（英）：

The invention discloses an on-chip SET(Single-Event Transient) pulse testing method based on a dynamic input vector and aims to provide an on-chip SET pulse testing method whose results are more approximate to those of a circuit in a practical working environment. The technical scheme includes steps of 1, designing an on-chip SET pulse testing circuit based on the dynamic input vector; 2, closing the on-chip SET pulse testing circuit based on the dynamic input vector and loading the dynamic input vector on the input terminal of an inverter chain; 3, placing the on-chip SET pulse testing circuit based on the dynamic input vector in a particle radiation environment, testing SET pulses and obtaining the SET pulses generated by the circuit under the dynamic input vector at an external port of an host finally. Compared with a traditional on-chip SET pulse testing method, the method provided by the invention is advantaged in that the measured SET pulse number, the width of each SET pulse and the average width of each SET pulse are more approximate to those of SET pulses generated by a circuit subjected to single particle bombardment during a practical working process, so that the testing results are more instructive and difficulty of soft error analysis of integrated circuits is reduced.

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