The invention relates to the technical field of packaging of integrated circuits, and discloses a sorted storing device for IC (Integrated Circuit) test. The device comprises an IC detection unit, an IC material plate unit, a first IC conveying unit, a rotary disc unit, a rotary operational unit and a second IC conveying unit, wherein the IC material plate unit comprises a storing position for the material plate to be detected and a storing position for the material plate to be placed. The rotary unit is arranged at the front end of the storing position for the material plate to be detected. The first IC conveying unit is located between the rotary disc unit and the storing position for the material plate to be detected. The rotary operational unit is located at one side of the rotary disc unit and comprises at least one rotary arm which circulates to be rotatably positioned above the rotary disc unit, the IC detection unit and the second conveying unit so as to sequentially absorb, detect and temporally store the IC. The second IC conveying unit respectively places the ICs after detection on different material plates to be placed according to the detection results. According to the device, high speed test and sorting of ICs can be realized.