An X-ray imaging device (1) is configured by a back-surface incident solid-state imaging element (10), on one surface (11) side of which an X-ray detection section in which a plurality of detection pixels for detecting incident X-rays are arranged is provided, and the other surface (12) of which serves as an X-ray incidence plane, and a shielding layer (20) which is provided on the incidence plane (12) of the imaging element (10), and which is used for the shielding of light of longer wavelengths than those of X-rays to be detected. The shielding layer (20) is provided with a first aluminum layer (21) which is directly provided on the incidence plane (12), a second aluminum layer (22) which is provided on the first aluminum layer (21), and an ultraviolet light shielding layer (25) which is provided between the first and second aluminum layers (21, 22), and which is used for the shielding of ultraviolet light. As a result, an X-ray imaging device capable of suppressing the effect of detection of noise light in X-ray detection is achieved.