公开(公告)号：US20070265789A1

公开(公告)日：2007-11-15

申请号：US11797621

申请日：2007-05-04

Applicant: Pranab Naik ,  Christopher Beling ,  Stevenson Fung

Inventor： Pranab Naik ,  Christopher Beling ,  Stevenson Fung

IPC: G06F19/00

CPC classification number: H01J37/256 ,  H01J2237/06391

Abstract: Disclosed is a fully automated system capable of producing high quality real-time S-parameter images. It is a useful and versatile tool in Material Science and Solid State Technology for determining the location of subsurface defect types and concentrations on bulk-materials as well as thin-films. The system is also useful in locating top surface metallizations and structures in solid state devices. This imaging system operates by scanning the sample surface with either a small positron source (22Na) or a focused positron beam. The system also possesses another two major parts, namely electronic instrumentation and stand-alone imaging software. In the system, the processing time and use of system resources are constantly monitored and optimized for producing high resolution S-parameter image of the sample in real time with a general purpose personal computer. The system software possesses special features with its embedded specialized algorithms and techniques that provide the user with adequate freedom for analyzing various aspects of the image in order to obtain a clear inference of the defect profile while at the same time keeping automatic track on the instrumentation and hardware settings. The system is useful for semiconductor and metal samples, giving excellent quality images of the subsurface defect profile and has applications for biological samples.

Abstract translation: 公开了一种能够产生高质量实时S参数图像的全自动系统。 它是材料科学和固态技术中有用和通用的工具，用于确定散装材料以及薄膜上地下缺陷类型和浓度的位置。 该系统还可用于固定固态器件中的顶表面金属化和结构。 该成像系统通过用小的正电子源（Na +）或聚焦的正电子束扫描样品表面来进行操作。 该系统还具有电子仪器和独立成像软件两个主要部分。 在系统中，不断监控和优化系统资源的处理时间和使用情况，以便用通用个人计算机实时生成样本的高分辨率S参数图像。 系统软件具有其嵌入式专用算法和技术的特殊功能，为用户提供了足够的自由度来分析图像的各个方面，以便获得缺陷轮廓的清晰推断，同时保持对仪器的自动跟踪， 硬件设置。 该系统对于半导体和金属样品是有用的，提供了优质的地下缺陷图像，并且具有生物样品的应用。

公开(公告)号：US07709819B2

公开(公告)日：2010-05-04

申请号：US12175856

申请日：2008-07-18

Applicant: Gerald A. Smith

Inventor： Gerald A. Smith

IPC: H05H13/00

CPC classification number: H01J3/40 ,  G21K1/00 ,  H01J2237/06391

Abstract: A long-term antimatter storage device that may be energized by a low power magnetron and can function autonomously for hundreds of hours on the energy provided by batteries. An evacuated, cryogenic container is arranged with a source of positrons and a source of electrons positioned in capture relation to one another within the container so as to allow for the formation of a plurality of positronium atoms. A microwave resonator is located within the container forming a circularly polarized standing wave within which the plurality of positronium atoms rotate. Radioactive sources for small stores and low energy positron accelerators for large stores are used to efficiently fill the device with positronium in seconds to minutes. The device may also be arranged to provide for the extraction of positrons. A method for storing antimatter is also provided.

Abstract translation: 一种长期的反物质储存装置，可以由低功率磁控管激励，并可以自动运行电池提供的能量上百小时。 真空的低温容器布置有正电子源和电子源，在容器内彼此捕获关系，以允许形成多个正电子原子。 微波谐振器位于容器内，形成圆偏振的驻波，多个正电子原子在其中旋转。 用于小商店的放射源和大型商店的低能量正电子加速器用于在数分钟至数分钟内用正电子体高效填充装置。 该装置还可以被布置成提供正电子的提取。 还提供了一种存储反物质的方法。

公开(公告)号：US6043489A

公开(公告)日：2000-03-28

申请号：US985397

申请日：1997-12-05

Applicant: Martin Tongbhoyai ,  Karl Maier ,  Holger Greif

Inventor： Martin Tongbhoyai ,  Karl Maier ,  Holger Greif

IPC: H01J37/26 ,  H01J37/08

CPC classification number: H01J37/26 ,  H01J2237/06391

Abstract: A positron source with high intensity and low energy bandwidth and small spatial dimensions, has a positron emitter of high specific activity and, following the positron emitter, a reflection moderator with a hole. The hole diameter on the emitter side of the reflection moderator is smaller than 0.4 mm, preferably below 0.1 mm. Because of the small hole diameter and the small energy spread, the phase space of the positrons coming from the positron source corresponds to the phase space of the electrons emitted by a conventional thermionic cathode. The positron source can therefore be used in a conventional scanning electron microscope, which can be selectively changed over between positron operation and electron operation. Two adjusting units and are provided for adjustment of the positron source.

Abstract translation: 具有高强度和低能量带宽和小空间尺寸的正电子源具有高比活性的正电子发射体，并且在正电子发射体之后具有带孔的反射调节剂。 反射调节剂的发射极侧的孔径小于0.4mm，优选为0.1mm以下。 由于小孔直径和小能量扩散，来自正电子源的正电子的相位空间对应于常规热离子阴极发射的电子的相位空间。 因此，正电子源可以用于常规扫描电子显微镜，其可以在正电子操作和电子操作之间选择性地改变。 两个调节单元，用于调整正电子源。

公开(公告)号：US08053724B2

公开(公告)日：2011-11-08

申请号：US12816218

申请日：2010-06-15

Applicant: Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

Inventor： Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

IPC: H01J37/256 ,  G01N23/22

CPC classification number: H01J37/256 ,  H01J2237/06391

Abstract: An instrumentation setup is provided to process electronic signals in a positron imager functioning in two different modes of operations for scanning both bulk and thin film materials. According to one part of an implementation, an instrumentation setup comprises an XY-rastering stepper motor apparatus coupled with LVDTs (Linear Variable Differential Transformers), and nuclear signal processing and high speed data acquisition sections. Imaging of bulk material samples may be enabled by scanning a positron point source across a surface of samples. In another part of the irnplenientation, the instrumentation setup may comprise an electromagnetic deflection control arrangement in conjunction with a guided monoenergetic positron beam together with nuclear signal processing and data acquisition arrangements. This part of the implementation may scan and produce images for thin film samples. The instrumentation setup is capable of producing high quality real-time S-parameter images.

Abstract translation: 提供了一种仪器设置来处理正电子成像器中的电子信号，该正电子成像器在两种不同的操作模式中工作，用于扫描体薄膜材料和薄膜材料。 根据实施方案的一部分，仪器设置包括与LVDT（线性可变差分变压器）耦合的XY扫描步进电机装置，以及核信号处理和高速数据采集部分。 散装材料样品的成像可以通过在样品表面上扫描正电子点源来实现。 在不平衡的另一部分中，仪器设置可以包括结合导向的单能正电子束和核信号处理和数据采集装置的电磁偏转控制装置。 这部分实现可以扫描和产生薄膜样品的图像。 仪器设置能够产生高质量的实时S参数图像。

公开(公告)号：US06818902B2

公开(公告)日：2004-11-16

申请号：US10725400

申请日：2003-12-03

Applicant: Patrice Perez ,  André Rosowsky

Inventor： Patrice Perez ,  André Rosowsky

IPC: H01J3726

CPC classification number: H01J37/065 ,  H01J27/20 ,  H01J2237/06391 ,  H01J2237/25 ,  H05H6/00

Abstract: A positron source is applicable particularly to solid state physics, including a thin target receiving a continuous or practically continuous 10 MeV electron beam in grazing incidence and generating positrons upon interaction with this beam.

Abstract translation: 正电子源特别适用于固体物理学，包括在与该光束相互作用时接收连续或实际上连续的10MeV电子束并在产生正电子的薄靶中。

公开(公告)号：US20020030160A1

公开(公告)日：2002-03-14

申请号：US09912372

申请日：2001-07-26

Inventor： Roderick G. Greaves

IPC: H01J037/252 ,  G01N023/225

CPC classification number: G21K1/003 ,  G01N23/225 ,  H01J3/40 ,  H01J2237/06391 ,  H01J2237/2516 ,  H01J2237/28

Abstract: A positron producing apparatus which includes a vacuum chamber with a source of positrons to be supplied into the vacuum chamber forming a positron cloud within a Penning Trap. The positron cloud is to be compressed producing a thin positron beam which is extracted from the cloud and is smaller in cross-sectional area than the cloud. The positron beam is to be transmitted to a focusing apparatus which transmits the positron beam onto a solid target. The vacuum chamber is to include a cooling gas to be supplied into the vacuum chamber and a compressing device for the positron cloud is to include a rotating electric field. A method for compressing the positron cloud to produce a thin positron beam, which is to be transmitted to a solid for the purpose of analyzing properties of the solid, comprises the steps of supplying a source of positrons within a vacuum environment, forming and containing the positron cloud within a Penning Trap, producing a positron beam, and focusing of that positron beam onto a solid. The method is also to include adding of a cooling gas within the vacuum environment.

Abstract translation: 一种正电子产生装置，其包括具有正电子源的真空室，以供应到真空室中，在Penning Trap内形成正电子云。 正电子云将被压缩，产生从云中提取的薄正电子束，并且横截面积比云更小。 正电子束将被传送到将正电子束传输到固体靶上的聚焦装置。 真空室将包括供给到真空室中的冷却气体，正电云的压缩装置将包括旋转电场。 用于压缩正电子云以产生薄正电子束的方法，其将被传输到固体以便分析固体的性质，包括以下步骤：在真空环境内供应正电子源，形成并包含 Penning Trap中的正电子云，产生正电子束，并将该正电子束聚焦在固体上。 该方法还包括在真空环境中添加冷却气体。

公开(公告)号：US07781732B2

公开(公告)日：2010-08-24

申请号：US11797621

申请日：2007-05-04

Applicant: Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

Inventor： Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

IPC: H01J49/00 ,  B01D59/44

CPC classification number: H01J37/256 ,  H01J2237/06391

Abstract: Disclosed is a fully automated system capable of producing high quality real-time S-parameter images. It is a useful and versatile tool in Material Science and Solid State Technology for determining the location of subsurface defect types and concentrations on bulk-materials as well as thin-films. The system is also useful in locating top surface metallizations and structures in solid state devices. This imaging system operates by scanning the sample surface with either a small positron source (22Na) or a focused positron beam. The system also possesses another two major parts, namely electronic instrumentation and stand-alone imaging software. In the system, the processing time and use of system resources are constantly monitored and optimized for producing high resolution S-parameter image of the sample in real time with a general purpose personal computer. The system software possesses special features with its embedded specialized algorithms and techniques that provide the user with adequate freedom for analyzing various aspects of the image in order to obtain a clear inference of the defect profile while at the same time keeping automatic track on the instrumentation and hardware settings. The system is useful for semiconductor and metal samples, giving excellent quality images of the subsurface defect profile and has applications for biological samples.

Abstract translation: 公开了一种能够产生高质量实时S参数图像的全自动系统。 它是材料科学和固态技术中有用和通用的工具，用于确定散装材料以及薄膜上地下缺陷类型和浓度的位置。 该系统还可用于固定固态器件中的顶表面金属化和结构。 该成像系统通过用小正电子源（22Na）或聚焦正电子束扫描样品表面来操作。 该系统还具有电子仪器和独立成像软件两个主要部分。 在系统中，不断监控和优化系统资源的处理时间和使用情况，以便用通用个人计算机实时生成样本的高分辨率S参数图像。 系统软件具有其嵌入式专用算法和技术的特殊功能，为用户提供了足够的自由度来分析图像的各个方面，以便获得缺陷轮廓的清晰推断，同时保持对仪器的自动跟踪， 硬件设置。 该系统对于半导体和金属样品是有用的，提供了优质的地下缺陷图像，并且具有生物样品的应用。

公开(公告)号：US20040178353A1

公开(公告)日：2004-09-16

申请号：US10725400

申请日：2003-12-03

Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE

Inventor： Patrice Perez ,  Andre Rosowsky

IPC: H01J027/20

CPC classification number: H01J37/065 ,  H01J27/20 ,  H01J2237/06391 ,  H01J2237/25 ,  H05H6/00

Abstract: This source is applicable particularly to solid state physics and comprises a thin target (28) receiving a continuous or practically continuous 10 MeV electron beam (22) in grazing incidence and generating positrons with interaction with this beam.

Abstract translation: 该源特别适用于固态物理学，并且包括在掠射入射中接收连续或实际上连续的10MeV电子束（22）的薄靶（28），并产生与该光束相互作用的正电子。

公开(公告)号：US06630666B2

公开(公告)日：2003-10-07

申请号：US09912372

申请日：2001-07-26

Applicant: Roderick G. Greaves

Inventor： Roderick G. Greaves

IPC: G01N2300

CPC classification number: G21K1/003 ,  G01N23/225 ,  H01J3/40 ,  H01J2237/06391 ,  H01J2237/2516 ,  H01J2237/28

Abstract: A positron producing apparatus which includes a vacuum chamber with a source of positrons to be supplied into the vacuum chamber forming a positron cloud within a Penning Trap. The positron cloud is to be compressed producing a thin positron beam which is extracted from the cloud and is smaller in cross-sectional area than the cloud. The positron beam is to be transmitted to a focusing apparatus which transmits the positron beam onto a solid target. The vacuum chamber is to include a cooling gas to be supplied into the vacuum chamber and a compressing device for the positron cloud is to include a rotating electric field. A method for compressing the positron cloud to produce a thin positron beam, which is to be transmitted to a solid for the purpose of analyzing properties of the solid, comprises the steps of supplying a source of positrons within a vacuum environment, forming and containing the positron cloud within a Penning Trap, producing a positron beam, and focusing of that positron beam onto a solid. The method is also to include adding of a cooling gas within the vacuum environment.

公开(公告)号：US20100322505A1

公开(公告)日：2010-12-23

申请号：US12816218

申请日：2010-06-15

Applicant: Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H.Y. Fung

Inventor： Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H.Y. Fung

IPC: G06K9/00 ,  G01T1/00

CPC classification number: H01J37/256 ,  H01J2237/06391

Abstract: Disclosed is a fully automated system capable of producing high quality real-time S-parameter images. It is a useful and versatile tool in Material Science and Solid State Technology for determining the location of subsurface defect types and concentrations on bulk-materials as well as thin-films. The system is also useful in locating top surface metallizations and structures in solid state devices. This imaging system operates by scanning the sample surface with either a small positron source (22Na) or a focused positron beam. The system also possesses another two major parts, namely electronic instrumentation and stand-alone imaging software. In the system, the processing time and use of system resources are constantly monitored and optimized for producing high resolution S-parameter image of the sample in real time with a general purpose personal computer. The system software possesses special features with its embedded specialized algorithms and techniques that provide the user with adequate freedom for analyzing various aspects of the image in order to obtain a clear inference of the defect profile while at the same time keeping automatic track on the instrumentation and hardware settings. The system is useful for semiconductor and metal samples, giving excellent quality images of the subsurface defect profile and has applications for biological samples.

Abstract translation: 公开了一种能够产生高质量实时S参数图像的全自动系统。 它是材料科学和固态技术中有用和通用的工具，用于确定散装材料以及薄膜上地下缺陷类型和浓度的位置。 该系统还可用于固定固态器件中的顶表面金属化和结构。 该成像系统通过用小正电子源（22Na）或聚焦正电子束扫描样品表面来操作。 该系统还具有电子仪器和独立成像软件两个主要部分。 在系统中，不断监控和优化系统资源的处理时间和使用情况，以便用通用个人计算机实时生成样本的高分辨率S参数图像。 系统软件具有其嵌入式专用算法和技术的特殊功能，为用户提供了足够的自由度来分析图像的各个方面，以便获得缺陷轮廓的清晰推断，同时保持对仪器的自动跟踪， 硬件设置。 该系统对于半导体和金属样品是有用的，提供了优质的地下缺陷图像，并且具有生物样品的应用。