-
公开(公告)号：US12183564B2
公开(公告)日：2024-12-31
申请号：US17437604
申请日：2020-02-28
Applicant: KRATOS ANALYTICAL LIMITED
Inventor： Andrew Bowdler , Ian Brookhouse , Neil Edmunds
Abstract: A mass spectrometry apparatus, including a mass spectrometer and a sample plate. The mass spectrometer includes: a sample plate holder configured to hold a sample plate in an engaged position. The mass spectrometer is configured to perform a mass spectrometric analysis of a sample only when the sample is located on a sample plate that is held in the engaged position by the sample plate holder. The mass spectrometer includes one or more engagement features configured to engage with a sample plate so as to prevent the sample plate from being held in the engaged position by the sample plate holder unless the sample plate includes one or more engagement features configured to limit use of the sample plate to a specific analytical technique or a range of analytical techniques to be performed using the mass spectrometer. The sample plate is configured for use in the specific analytical technique or range of analytical techniques, wherein the sample plate includes the one or more engagement features configured to limit use of the sample plate to the specific analytical technique or range of analytical techniques.
-
公开(公告)号：US20170309464A1
公开(公告)日：2017-10-26
申请号：US15516056
申请日：2015-09-21
Applicant: KRATOS ANALYTICAL LIMITED
Inventor： John Mark ALLISON
CPC classification number: H01J49/164 , B08B7/0035 , B08B7/0042 , B08B7/0057
Abstract: A method of cleaning an ion source. The method includes: at a first reflective surface of a mirror, reflecting light that has a wavelength in a first wavelength band onto a surface of the ion source so that contaminant material is desorbed from the surface of the ion source; at a second reflective surface of the mirror, reflecting light that has a wavelength in a second wavelength band and that comes from the surface of the ion source towards an imaging apparatus for producing an image of the surface of the ion source, wherein the light that has a wavelength in the second wavelength band passes through the first reflective surface of the mirror before being reflected at the second reflective surface of the mirror.
-
公开(公告)号：US20150162176A1
公开(公告)日：2015-06-11
申请号：US14234772
申请日：2012-07-25
Applicant: Ursula Gäb
Inventor： Oliver J. Schmitz , Volker Wulf , Lukas Hyzak , Michaela Wirtz , David Melchior , Hans Willi Kling , Siegmar Gäb
CPC classification number: H01J49/0031 , G01N1/38 , H01J49/0036 , H01J49/0418 , H01J49/0459 , H01J49/164
Abstract: The present invention is concerned with a method of preparing a MALDI sample, the method comprising the steps of: (a) mixing a solid sample precursor comprising sample and matrix to form a solid sample mixture; (b) applying the solid sample mixture to a sample cavity of a MALDI target; and (c) compressing the solid sample mixture in the sample cavity so as to form a MALDI sample surface for laser desorption. The present invention also provides a MALDI target comprising a sample cavity for receiving a MALDI sample, the sample cavity having (a) a desorption end portion comprising an aperture, such that a portion of the MALDI sample exposed at the aperture is in use subjected to laser desorption; and wherein the sample cavity also has (b) a compression end portion adapted to permit compression of a solid sample mixture towards the desorption end portion in the sample cavity by applying a compression force to the solid sample mixture via the compression end portion.
Abstract translation: 本发明涉及一种制备MALDI样品的方法，该方法包括以下步骤：（a）将包含样品和基质的固体样品前体混合以形成固体样品混合物; （b）将固体样品混合物施加到MALDI靶的样品腔中; 和（c）压缩样品腔中的固体样品混合物，以便形成用于激光解吸的MALDI样品表面。 本发明还提供了一种MALDI靶，其包括用于接收MALDI样品的样品腔，所述样品腔具有（a）包含孔的解吸端部，使得在所述孔处露出的部分MALDI样品在使用中受到 激光解吸; 并且其中所述样品腔还具有（b）压缩端部，其适于通过经由所述压缩端部向所述固体样品混合物施加压缩力而使固体样品混合物朝向所述样品腔中的解吸端部压缩。
-
公开(公告)号：US08791408B2
公开(公告)日：2014-07-29
申请号：US13810968
申请日：2011-07-28
Applicant: Andrew Bowdler
Inventor： Andrew Bowdler
CPC classification number: H01J49/0036 , H01J49/0022 , H01J49/0027 , H01J49/26 , H01J49/40
Abstract: The present invention is concerned with methods and apparatuses for generating mass spectrum data using a mass spectrometer by subtracting noise mass spectrum data representative of noise in the mass spectrometer from signal mass spectrum data representative of the mass/charge ratio of ions in a sample material. This produces a modified signal mass spectrum data representative of the mass/charge ratio of ions in the sample material. The method includes acquiring and subtracting noise mass spectrum data representative of noise in the mass spectrometer or alternatively subtracting noise mass spectrum data from a previously acquired or pre-stored noise spectrum data. Embodiments demonstrate reduced noise and in particular reduced systematic noise compared with the originally acquired signal mass spectrum data.
Abstract translation: 本发明涉及使用质谱仪通过从表示样品材料中的离子的质量/电荷比的信号质谱数据中减去表示质谱仪中的噪声的噪声质谱数据来生成质谱数据的方法和装置。 这产生了代表样品材料中离子的质量/电荷比的修改的信号质谱数据。 该方法包括获取和减去表示质谱仪中噪声的噪声质谱数据，或者从先前获取的或预先存储的噪声谱数据中减去噪声质谱数据。 与原始采集的信号质谱数据相比，实施例表现出降低的噪声，特别是降低的系统噪声。
-
公开(公告)号：US20110139973A1
公开(公告)日：2011-06-16
申请号：US13054295
申请日：2009-07-16
Applicant: Andrew Bowdler
Inventor： Andrew Bowdler
CPC classification number: H01J49/40 , H01J49/0004 , H01J49/067
Abstract: The present invention is concerned with improving the focusing of ions having a particular mass to charge ratio by optimising the electric field for the focusing of ions having that particular mass to charge ratio. In particular, the stigmatic focusing of ions can be improved by adjusting a voltage applied to an ion-optical lens 50 for ions of different mass to charge ratios as those ions pass through the lens. In one embodiment, a digital to analogue converter 32 and amplifier 34 are AC coupled to a high voltage DC power supply unit 38 by high voltage capacitor 36. The digital to analogue converter 32 generates a low voltage wave form which is amplified by the amplifier 34 and then added to the output of the high voltage supply 38 so that the desired voltage waveform is generated and applied to ion-optical lens 50 as ions pass through the lens.
Abstract translation: 本发明涉及通过优化具有该特定质荷比的离子的聚焦的电场来改进具有特定质荷比的离子的聚焦。 特别地，通过调节离子光学透镜50对于离子通过透镜而具有不同质荷比的离子的电压，可以提高离子的眩光聚焦。 在一个实施例中，数模转换器32和放大器34通过高电压电容器36与高电压DC电源单元38交流耦合。数模转换器32产生由放大器34放大的低电压波形 然后添加到高压电源38的输出端，使得产生期望的电压波形并且当离子通过透镜时将其施加到离子光学透镜50。
-
Patent Agency Ranking
公开(公告)号：US07910878B2
公开(公告)日：2011-03-22
申请号：US12506605
申请日：2009-07-21
Applicant: Andrew Bowdler
Inventor： Andrew Bowdler
IPC: H01J49/26
CPC classification number: H01J49/40 , H01J49/06 , H01J49/067
Abstract: The present invention provides a mass spectrometer including an ion source for generating pre-cursor ions, ion fragmentation means for generating fragment ions from the pre-cursor ions, a reflectron for focusing the kinetic energy distribution of the ions, and an ion detector wherein the mass spectrometer also includes axial spatial distribution focusing means which in use acts on the ions after the ion fragmentation means and before the reflectron, the axial spatial distribution focusing means being operable to reduce the spatial distribution of the ions in the direction of the ion optical axis of the spectrometer. Suitably the axial spatial distribution focusing means comprising a cell with two electrodes 52, 54 which may be apertures or high transmission grids. A pulsed electrostatic field is generated by applying a high voltage pulse 60 to the first electrode 52 at the time when the pre-cursor ions of interest 56, 58 have just passed into the pulser 50. The second electrode 54 is maintained at 0V during this time.
Abstract translation: 本发明提供了一种质谱仪，其包括用于产生前体离子的离子源，用于从前体离子产生碎片离子的离子碎裂装置，用于聚焦离子的动能分布的反射器，以及离子检测器，其中 质谱仪还包括轴向空间分布聚焦装置，其在使用中作用于离子碎片装置之后的离子并且在反射体之前，轴向空间分布聚焦装置可操作以减少离子在离子光轴方向上的空间分布 的光谱仪。 适当地，轴向空间分布聚焦装置包括具有两个电极52,54的单元，其可以是孔或高传输格栅。 当感兴趣的前置离子56,58刚刚进入脉冲发生器50时，通过将高电压脉冲60施加到第一电极52来产生脉冲静电场。在此期间，第二电极54保持在0V 时间。
-
公开(公告)号：US20100176288A1
公开(公告)日：2010-07-15
申请号：US12602541
申请日：2008-06-02
Applicant: Alan Barnes , Rod Fry
Inventor： Alan Barnes , Rod Fry
CPC classification number: H01J49/164 , H01J49/0004
Abstract: The present invention provides a method of generating ions from a sample, the method comprising the steps of (1) designating a plurality of sample target sites, and (2) for each of said plurality of sample target sites, generating ions from a plurality of locations associated with the sample target site, wherein said plurality of locations are selected automatically with reference to the said sample target site. Each of the plurality of sample target sites is associated with a discrete sample region, wherein the sample is part of a MALDI ion source and the plurality of discrete sample regions comprise regions of matrix, suitably formed by chemical inkjet printing. The plurality of locations can be at least 5 and preferably at least 10 locations, each of which can be selected randomly or in accordance with a predetermined pattern. Ions generated from the plurality of locations associated with each of the sample target sites are assigned only a single set of sample position coordinates, which coordinates correspond to those of the sample target site. This averaging technique leads to improved data reliability.
Abstract translation: 本发明提供了一种从样品中产生离子的方法，所述方法包括以下步骤：（1）指定多个样品靶位点，和（2）对于所述多个样品靶位点中的每一个，从多个样品靶位点产生离子 与样本目标位置相关联的位置，其中参考所述样本目标位置自动选择所述多个位置。 多个样本目标位置中的每一个与离散样本区域相关联，其中样本是MALDI离子源的一部分，并且多个离散样本区域包括通过化学喷墨印刷适当形成的矩阵区域。 多个位置可以是至少5个并且优选地至少10个位置，每个位置可以随机地或根据预定模式来选择。 从与每个样本目标位置相关联的多个位置生成的离子仅被分配一组样本位置坐标，其坐标对应于样本目标位点的坐标。 这种平均技术导致数据可靠性的提高。
-
公开(公告)号：US07579586B2
公开(公告)日：2009-08-25
申请号：US11104674
申请日：2005-04-13
Applicant: Andrew Bowdler , Ian Brookhouse , Emmanuel Raptakis
Inventor： Andrew Bowdler , Ian Brookhouse , Emmanuel Raptakis
IPC: H01J49/00
CPC classification number: H01J49/40 , H01J49/061
Abstract: The present invention provides an ion selector gate having a first deflection zone 32 and a second deflection zone 34 spaced from the first deflection zone, wherein in use, a single low voltage trigger pulse generated by timing electronics with a width in time equal to or proportional to the width of the gate pulse Tgd and at a position in time that the ion gate is required to be open to allow through ions of the correct nominal mass. The trigger pulse may go through an inverter 38 and then to two high voltage pulsers 40 and 42. The high voltage pulsers each produce simultaneously a signal that switches to ground and back on again from the same amplitude high voltage but the opposite polarity. The outputs of the high voltage pulsers are connected to interleaved wires of both ion gates 32, 34. Thus, the high voltage pulsers are applied simultaneously to both ion gates.
Abstract translation: 本发明提供了一种离子选择器门，其具有与第一偏转区间隔开的第一偏转区域32和第二偏转区域34，其中在使用中，通过定时电子器件产生的单个低电压触发脉冲，其时间宽度等于或等于 到栅极脉冲Tgd的宽度，并且在离子门需要开放以允许通过正确标称质量的离子的时间的位置。 触发脉冲可以通过反相器38，然后通过两个高电压脉冲发生器40和42.高电压脉冲发生器同时产生从相同幅度的高电压但相反的极性开始接地并重新接通的信号。 高电压脉冲发生器的输出端连接到两个离子门32,34的交错电线。因此，高电压脉冲发生器同时施加到两个离子门。
-
公开(公告)号：US20220157590A1
公开(公告)日：2022-05-19
申请号：US17437604
申请日：2020-02-28
Applicant: KRATOS ANALYTICAL LIMITED
Inventor： Andrew BOWDLER , Ian BROOKHOUSE , Neil EDMUNDS
Abstract: A mass spectrometry apparatus, including a mass spectrometer and a sample plate. The mass spectrometer includes: a sample plate holder configured to hold a sample plate in an engaged position. The mass spectrometer is configured to perform a mass spectrometric analysis of a sample only when the sample is located on a sample plate that is held in the engaged position by the sample plate holder. The mass spectrometer includes one or more engagement features configured to engage with a sample plate so as to prevent the sample plate from being held in the engaged position by the sample plate holder unless the sample plate includes one or more engagement features configured to limit use of the sample plate to a specific analytical technique or a range of analytical techniques to be performed using the mass spectrometer. The sample plate is configured for use in the specific analytical technique or range of analytical techniques, wherein the sample plate includes the one or more engagement features configured to limit use of the sample plate to the specific analytical technique or range of analytical techniques.
-
公开(公告)号：US08969796B2
公开(公告)日：2015-03-03
申请号：US14205444
申请日：2014-03-12
Applicant: Kratos Analytical Limited
Inventor： Ian Sherwood
CPC classification number: H01J49/022 , G06F13/4295 , H01J49/40 , H03K5/133 , H03M9/00 , H04L7/00 , H04L7/033
Abstract: The present invention provides a timing device, especially a timing device for use in mass spectrometers, for example TOF mass spectrometers, for processing trigger signal data containing a trigger signal indicating the occurrence of a trigger event, the timing device having: a trigger signal deserializer configured to receive trigger signal data containing a trigger signal indicating the occurrence of a trigger event as serial data and to output the trigger signal data as parallel data, and wherein suitably the timing device has a processing means configured to process trigger signal data outputted by the trigger signal deserializer as parallel data.
Abstract translation: 本发明提供了一种定时装置，特别是在质谱仪中使用的定时装置，例如TOF质谱仪，用于处理包含指示触发事件发生的触发信号的触发信号数据，定时装置具有：触发信号解串器 被配置为接收包含指示触发事件发生的触发信号的触发信号数据作为串行数据，并且将触发信号数据作为并行数据输出，并且其中适当地，定时装置具有处理装置，其被配置为处理由 触发信号解串器作为并行数据。
-
-
-
-
-
-
-
-
-
Search Results
48
records
(took 0.036 seconds)
