公开(公告)号：US10318681B1

公开(公告)日：2019-06-11

申请号：US15635461

申请日：2017-06-28

Applicant: Xilinx, Inc.

Inventor： Fu-Hing Ho ,  Johnie Au

IPC: G06F17/50

Abstract: Leakage current estimation for a circuit can include generating a cell leakage library including cell-level leakage current geometry data for different states of cells of a cell library, wherein the cells are specified as transistor-level netlists, and determining, using a processor, gate-level leakage current geometry data for gates of a gate-level netlist for the circuit based upon states of the gates for a selected operating state of the circuit and the cell-level leakage current geometry data. Total leakage current geometry data can be determined, using the processor, for the gate-level netlist by aggregating the gate-level leakage current geometry data.