THIN PROFILE METAL TRACE TO SUPPRESS SKIN EFFECT AND EXTEND PACKAGE INTERCONNECT BANDWIDTH
    1.
    发明申请
    THIN PROFILE METAL TRACE TO SUPPRESS SKIN EFFECT AND EXTEND PACKAGE INTERCONNECT BANDWIDTH 审中-公开
    薄型金属追踪,以减轻皮肤的影响和扩大包装互连带宽

    公开(公告)号:US20150282299A1

    公开(公告)日:2015-10-01

    申请号:US14242795

    申请日:2014-04-01

    Applicant: XILINX, INC.

    Abstract: Embodiments of the invention generally provide an electronic device comprising an electrical interconnect component that includes an electrical trace. The electrical trace has geometric characteristics that serve to suppress the skin effect over a large band of frequency components. More specifically, the electrical trace has a thickness that is less than a skin depth for a particular chosen frequency component. By making the electrical trace have a thickness that is less than the skin depth, the current flows through substantially the entire cross-sectional area of the electrical trace for all frequencies up to the chosen frequency component, which reduces the effects associated with the skin effect.

    Abstract translation: 本发明的实施例通常提供一种包括电互连部件的电子设备,其包括电迹线。 电迹线具有几何特征,其用于抑制大频带组件的皮肤效应。 更具体地,电迹线具有小于特定选定频率分量的趋肤深度的厚度。 通过使电迹线具有小于皮肤深度的厚度,电流流过所有频率的电迹线的整个横截面积直到选定的频率分量,这降低了与皮肤效应相关的影响 。

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