Light source wavelength correction
    1.
    发明申请
    Light source wavelength correction 有权
    光源波长校正

    公开(公告)号:US20060139649A1

    公开(公告)日:2006-06-29

    申请号:US10560440

    申请日:2004-06-03

    Applicant: Willis Howard

    Inventor: Willis Howard

    Abstract: A wavelength correction function provides corrected reflectance values from actual reflectance values taken in a reflectance-base instrument. The correction is provided as a function of measured reflectance values and a predefined set of high resolution reflectance values established for the reflectance-based instrument implementing the wavelength correction function.

    Abstract translation: 波长校正功能提供从反射率仪器中获取的实际反射率值的校正反射率值。 根据测量的反射率值和为实现波长校正功能的基于反射率的仪器建立的预定的一组高分辨率反射率值提供校正。

    Reflectance spectroscope with read head for minimizing singly-reflected
light rays
    2.
    发明授权
    Reflectance spectroscope with read head for minimizing singly-reflected light rays 失效
    具有用于最小化单反射光线的读头的反射光谱仪

    公开(公告)号:US5661563A

    公开(公告)日:1997-08-26

    申请号:US647122

    申请日:1996-05-09

    CPC classification number: G01N21/8483 G01N21/474

    Abstract: A reflectance spectroscope, which is provided with one or more optical paths which prevent substantially all singly reflected light rays from reaching the intended destination(s), is provided with a source of illumination for generating light rays, a support member adapted to support a reagent pad, the support member having a position in which the reagent pad is illuminated by the light rays generated by the illumination source, a reflectance detector positioned to receive light rays from the reagent pad, and means for defining an optical path in which substantially all singly-reflected light rays are prevented from reaching the intended destination. The optical path may be between the illumination source and the reagent pad, or between the reagent pad and the area in which the detector is provided.

    Abstract translation: 设置有防止基本上所有单一反射光线到达预期目的地的一个或多个光路的反射分光镜设置有用于产生光线的照明源,适于支撑试剂的支撑构件 垫,支撑构件具有其中试剂垫被照明源产生的光照射的位置,位于接收来自试剂垫的光线的反射率检测器,以及用于限定基本上全部单独的光路的装置 反射的光线被防止到达目的地。 光路可以在照明源和试剂垫之间,或者在试剂垫与设置有检测器的区域之间。

    Reflectance photometer
    3.
    发明授权
    Reflectance photometer 失效
    反射光度计

    公开(公告)号:US4890926A

    公开(公告)日:1990-01-02

    申请号:US135252

    申请日:1987-12-21

    CPC classification number: G01N21/474 G01N2021/478 G01N21/21

    Abstract: A reflectance photometer for quantitatively measuring diffuse light includes a light source located above a sample. The reflectance photometer also includes a first detector mounted at a preselected scattering angle relative to an axis extending perpendicularly from the sample through the light source. A first linear polarizer is mounted between the sample and the light source. The direction of polarization of the first linear polarizer is vertical to a scattering plane defined by the direction of incoming light from the light source and the direction of reflected light detected by the first detector. A second linear polarizer is mounted between the sample and the first detector. The direction of the second polarizer is parallel to the scattering plane. The reflectance photometer can include a second detector mounted at a second, scattering angle. A third linear polarizer is mounted between the sample and the second detector. The direction of polarization of the third linear polarizer can be perpendicular or parallel to the scattering plane. Generally, the three polarizers are close such that the contributors of scattered light as related to surface noise will be minimized for the first detector and maximized for the second detector, respectively. The optimum settings of the polarizer will depend on the settings of the polarizers, the scattering geometry, the sample orientation and the bulk and surface scattering properties of the sample material.

Patent Agency Ranking