INDICATOR TESTING SYSTEM
    1.
    发明申请
    INDICATOR TESTING SYSTEM 审中-公开
    指示器测试系统

    公开(公告)号:US20130175434A1

    公开(公告)日:2013-07-11

    申请号:US13432474

    申请日:2012-03-28

    IPC分类号: G01J1/42

    CPC分类号: G01J1/0214

    摘要: An indicator testing system for testing a plurality of indicators disposed on an electronic product and adapted to display a status includes a plurality of light sensors, a holder for holding the light sensors, and a signal processing module. The light sensors correspond in position to the indicators on the electronic product, respectively, and each generate a corresponding light testing signal whereby the signal processing module generates a brightness testing signal related to each indicator. The indicator testing system speeds up an indicator test, enhances the precision of the indicator test, and ensures the quality of the electronic product.

    摘要翻译: 用于测试布置在电子产品上并适于显示状态的多个指示器的指示器测试系统包括多个光传感器,用于保持光传感器的保持器和信号处理模块。 光传感器分别对应于电子产品上的指示器,并且各自产生相应的光测试信号,由此信号处理模块产生与每个指示器相关的亮度测试信号。 指标测试系统加快指标测试,提高指标测试精度,确保电子产品质量。