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    SCANNING ELECTROCHEMICAL MICROSCOPY
    5.
    发明申请
    SCANNING ELECTROCHEMICAL MICROSCOPY 有权
    扫描电化学显微镜

    公开(公告)号：US20150129436A1

    公开(公告)日：2015-05-14

    申请号：US14398707

    申请日：2013-05-01

    Applicant: The University of Warwick

    Inventor： Patrick Robert Unwin ,  Kim Martin McKelvey

    IPC: G01Q60/60

    CPC classification number: G01Q60/60 ,  B82Y35/00

    Abstract: A method of controlling a scanning electrochemical microscopy probe tip comprising the following steps: oscillating the scanning electrochemical microscopy probe tip relative to the surface of interest; moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest; detecting damping of an amplitude of the oscillation of the scanning electrochemical microscopy probe tip resulting from the scanning electrochemical microscopy probe tip coming into contact with the surface of interest at the first location; using the detected damping to detect the surface of interest; retracting the scanning electrochemical microscopy probe tip away from the surface of interest without first translating the scanning electrochemical microscopy probe tip along the surface of interest whilst the scanning electrochemical microscopy probe tip is in intermittent contact with the surface of interest. The method further comprises measuring electrochemical signals produced at the oscillating scanning electrochemical microscopy probe tip whilst moving the oscillating scanning electrochemical microscopy probe tip towards and/or away from the surface of interest.

    Abstract translation: 一种控制扫描电化学显微镜探针尖端的方法，包括以下步骤：相对于感兴趣的表面振荡扫描电化学显微镜探针尖端; 将振荡扫描电化学显微镜探针尖端移向感兴趣的表面; 检测扫描电化学显微镜探针尖端的振荡幅度的阻尼，其由扫描电化学显微镜探针尖端在第一位置处与感兴趣的表面接触; 使用检测到的阻尼来检测感兴趣的表面; 在扫描电化学显微镜探针尖端与感兴趣的表面间歇接触时，将扫描电化学显微镜探针尖端远离目标表面缩回，而不首先沿着感兴趣的表面平移扫描电化学显微镜探针尖端。 该方法还包括测量在振荡扫描电化学显微镜探针尖端处产生的电化学信号，同时将振荡扫描电化学显微镜探针尖端朝向和/或远离感兴趣的表面移动。

    Scanning electrochemical microscopy
    6.
    发明授权
    Scanning electrochemical microscopy 有权

    公开(公告)号：US10006935B2

    公开(公告)日：2018-06-26

    申请号：US14398707

    申请日：2013-05-01

    Applicant: The University of Warwick

    Inventor： Patrick Robert Unwin ,  Kim Martin McKelvey

    IPC: G01Q60/60 ,  G01Q40/00 ,  B82Y35/00

    CPC classification number: G01Q60/60 ,  B82Y35/00

    Abstract: A method of controlling a scanning electrochemical microscopy probe tip comprising the following steps: oscillating the scanning electrochemical microscopy probe tip relative to the surface of interest; moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest; detecting damping of an amplitude of the oscillation of the scanning electrochemical microscopy probe tip resulting from the scanning electrochemical microscopy probe tip coming into contact with the surface of interest at the first location; using the detected damping to detect the surface of interest; retracting the scanning electrochemical microscopy probe tip away from the surface of interest without first translating the scanning electrochemical microscopy probe tip along the surface of interest while the scanning electrochemical microscopy probe tip is in intermittent contact with the surface of interest. The method further comprises measuring electrochemical signals produced at the oscillating scanning electrochemical microscopy probe tip while moving the oscillating scanning electrochemical microscopy probe tip towards and/or away from the surface of interest.

    SCANNING ELECTROCHEMICAL MICROSCOPY
    7.
    发明申请
    SCANNING ELECTROCHEMICAL MICROSCOPY 审中-公开
    扫描电化学显微镜

    公开(公告)号：US20150059027A1

    公开(公告)日：2015-02-26

    申请号：US14504357

    申请日：2014-10-01

    Applicant: University of Warwick

    Inventor： Patrick Unwin ,  Kim Martin McKelvey

    IPC: G01Q60/60

    CPC classification number: G01Q60/60 ,  B22D19/14 ,  C23C26/02 ,  E21C35/183 ,  E21C2035/1806 ,  E21C2035/1809 ,  E21C2035/1813 ,  Y10T428/12937 ,  Y10T428/12965

    Abstract: A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.

    Abstract translation: 介绍了一种能够独立解决地形和表面活动的新型扫描电化学显微镜尖端定位方法。 SECM尖端相对于感兴趣的表面振荡。 由SECM尖端与感兴趣的表面的间歇接触引起的振荡幅度的变化用于检测感兴趣的表面，并且用作各种成像的反馈信号。

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