公开(公告)号：US10724960B2

公开(公告)日：2020-07-28

申请号：US15129273

申请日：2015-03-31

Applicant: The University of Tokyo ,  RICOH ELEMEX CORPORATION

Inventor： Toru Kurihara ,  Shigeru Ando ,  Michihiko Yoshimura

IPC: G01N21/88

Abstract: An inspection system of an embodiment includes: a planar illumination unit that temporally varies an intensity of light in a periodic manner by spatially moving a stripe pattern of the intensity of light; a time-correlation image generator that generates a time-correlation image with a time-correlation camera or an image capturing system that performs an operation equivalent to that of the time-correlation camera; and a calculation processor that calculates a characteristic from the time-correlation image, the characteristic corresponding to a distribution of normal vectors to an inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface.

公开(公告)号：US10739272B2

公开(公告)日：2020-08-11

申请号：US15300549

申请日：2015-03-31

Applicant: The University of Tokyo ,  KOCHI PREFECTURAL PUBLIC UNIVERSITY CORPORATION

Inventor： Toru Kurihara ,  Shigeru Ando

IPC: G01N21/88 ,  G06K9/46

Abstract: An inspection system of an embodiment includes: a planar illumination unit that temporally and spatially varies intensities of light in a periodic manner; a time-correlation image generator that generates a time-correlation image with a time-correlation camera or an image capturing system that performs an operation equivalent to that of the time-correlation camera; and a calculation processor that calculates a characteristic from the time-correlation image, the characteristic corresponding to a distribution of normal vectors to an inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface.