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公开(公告)号:US20240192294A1
公开(公告)日:2024-06-13
申请号:US18531226
申请日:2023-12-06
Applicant: The MITRE Corporation
CPC classification number: G01R33/323 , G01R33/48
Abstract: Disclosed herein are systems and methods for measuring integrated circuit activity via spatial resolution of optically detected magnetic resonance (ODMR) of nitrogen-vacancies (NV) in diamond. A quantum diamond microscope (QDM) can be used to capture a series of images of the fluorescence of NV centers present in diamond as a function of an external microwave field. An IC device placed adjacent to the diamond of the QDM will impact the fluorescence of the NV center, and this magnetic field-dependent fluorescence can be measured and used to generate a map of the magnetic field of the IC device.