公开(公告)号：US20180191400A1

公开(公告)日：2018-07-05

申请号：US15394676

申请日：2016-12-29

Applicant: TEKTRONIX, INC.

Inventor： Noah Brummer

IPC: H04B3/54 ,  H04H20/84 ,  H04L12/18

Abstract: A sampling gate comprising a first frequency input coupled to a first frequency path from a broadband photodiode. The sampling gate also includes a positive bias input coupled to a positive offset portion of a second frequency path from the broadband photodiode. The sampling gate also includes a negative bias input coupled to a negative offset portion of the second frequency path from the broadband photodiode. The sampling gate combines a first frequency signal from the first frequency path and a second frequency signal from the second frequency path to create a combined broadband frequency signal from the broadband photodiode.

公开(公告)号：US10666321B2

公开(公告)日：2020-05-26

申请号：US15394676

申请日：2016-12-29

Applicant: TEKTRONIX, INC.

Inventor： Noah Brummer

IPC: G01J1/44 ,  H04B3/54

Abstract: A sampling gate comprising a first frequency input coupled to a first frequency path from a broadband photodiode. The sampling gate also includes a positive bias input coupled to a positive offset portion of a second frequency path from the broadband photodiode. The sampling gate also includes a negative bias input coupled to a negative offset portion of the second frequency path from the broadband photodiode. The sampling gate combines a first frequency signal from the first frequency path and a second frequency signal from the second frequency path to create a combined broadband frequency signal from the broadband photodiode.

公开(公告)号：US20240369665A1

公开(公告)日：2024-11-07

申请号：US18652163

申请日：2024-05-01

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Noah Brummer ,  Roger D. Bighouse

IPC: G01R35/00 ,  G01R1/067 ,  G01R13/02

Abstract: A test and measurement accessory has an input to receive an input signal from a device under test (DUT), a pilot signal generator to generate a pilot signal, an E/O converter to convert the input signal and the pilot signal to a combined optical signal, an O/E converter to convert the combined optical signal to a combined electrical signal, a signal separator to separate the pilot signal from the combined electrical signal, an amplitude detector to determine amplitude of the separated pilot signal, and circuitry to adjust a gain of a signal path using the amplitude. A test and measurement accessory has an input to receive an input signal from a DUT, an E/O converter to produce an optical signal, an optical splitter to split the optical signal into a feedback portion and a remaining portion, a feedback photodiode to produce a feedback electrical signal to adjust the optical signal.

公开(公告)号：US11323152B2

公开(公告)日：2022-05-03

申请号：US16854758

申请日：2020-04-21

Applicant: TEKTRONIX, INC.

Inventor： Noah Brummer

IPC: H04B3/54

Abstract: A sampling gate comprising a first frequency input coupled to a first frequency path from a broadband photodiode. The sampling gate also includes a positive bias input coupled to a positive offset portion of a second frequency path from the broadband photodiode. The sampling gate also includes a negative bias input coupled to a negative offset portion of the second frequency path from the broadband photodiode. The sampling gate combines a first frequency signal from the first frequency path and a second frequency signal from the second frequency path to create a combined broadband frequency signal from the broadband photodiode.

公开(公告)号：US12019098B2

公开(公告)日：2024-06-25

申请号：US16883755

申请日：2020-05-26

Applicant: Tektronix, Inc.

Inventor： Noah Brummer ,  Andy K. Lim ,  Jan P. Peeters Weem

IPC: G01R13/34 ,  G01R13/02 ,  H04L27/233

CPC classification number: G01R13/345 ,  G01R13/0272 ,  H04L27/233

Abstract: An equivalent-time sampling test and measurement instrument for acquiring a repeating pattern signal under test at or near a maximum sampling speed of the test and measurement instrument. The test and measurement instrument includes a first input configured to receive repeating pattern information about a signal under test, a second input configured to receive the signal under test, one or more processors configured to determine an optimized trigger holdoff period that is set based on a minimum trigger holdoff period of a test and measurement instrument, and an acquisition unit configured to acquire a portion of the signal under test every optimized trigger holdoff period.

公开(公告)号：US20200252104A1

公开(公告)日：2020-08-06

申请号：US16854758

申请日：2020-04-21

Applicant: TEKTRONIX, INC.

Inventor： Noah Brummer

IPC: H04B3/54

Abstract: A sampling gate comprising a first frequency input coupled to a first frequency path from a broadband photodiode. The sampling gate also includes a positive bias input coupled to a positive offset portion of a second frequency path from the broadband photodiode. The sampling gate also includes a negative bias input coupled to a negative offset portion of the second frequency path from the broadband photodiode. The sampling gate combines a first frequency signal from the first frequency path and a second frequency signal from the second frequency path to create a combined broadband frequency signal from the broadband photodiode.