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公开(公告)号:US20230148028A1
公开(公告)日:2023-05-11
申请号:US17894715
申请日:2022-08-24
发明人: Tomohiro Sekiya , Kensaku Miyazawa , Kazuo Tojima , Hitoshi Nakamura , Haruyoshi Sakakibara , Yasutaka Terashima
IPC分类号: G01R31/52 , G01R31/385
CPC分类号: G01R31/52 , G01R31/3865
摘要: A method for evaluating an electric power storage device includes causing a short circuit by inserting an electrically conductive probe into a stacked portion in a thickness direction of electrode layers; measuring a penetration depth of the probe after the short circuit occurs; and evaluating the number of electrode layers involved in the short circuit based on the penetration depth. The penetration depth is identified by measuring a length of an adhesion portion in an axial direction of the probe. The adhesion portion is a portion of a surface of the probe to which a constituent material of the stacked portion adheres.