公开(公告)号：US20240361260A1

公开(公告)日：2024-10-31

申请号：US18619796

申请日：2024-03-28

申请人： TOHOKU UNIVERSITY ,  SUMITOMO RUBBER INDUSTRIES, LTD.

发明人： Hiroshi JINNAI ,  Tomohiro MIYATA ,  Daisuke WATANABE ,  Wakana ITO ,  Takehiro KITAURA

IPC分类号： G01N23/20058

CPC分类号： G01N23/20058 ,  G01N2223/0566 ,  G01N2223/418 ,  G01N2223/602

摘要： To provide an analysis method that can analyze a crystal structure, a crystal morphology, a crystal distribution of a rubber material in stretching even in a local portion of the rubber material. The present disclosure relates to a method of analyzing a crystal structure, a crystal morphology, or a crystal distribution of a rubber material in stretching using a nanodiffraction imaging technique that analyzes an electron diffraction pattern acquired by scanning electron beams converged to a diameter of 100 nm or less on a surface of the rubber material while a behavior of stretching deformation of the rubber material and/or a state of the rubber material in stretching are observed using a transmission electron microscope.