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公开(公告)号：US20200319446A1
公开(公告)日：2020-10-08
申请号：US16837512
申请日：2020-04-01
Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
Inventor： Michael S. Georgiadis , Francis J. Deck
Abstract: Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.
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公开(公告)号：US11604341B2
公开(公告)日：2023-03-14
申请号：US16837512
申请日：2020-04-01
Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
Inventor： Michael S. Georgiadis , Francis J. Deck
Abstract: Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.
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公开(公告)号：US10670462B2
公开(公告)日：2020-06-02
申请号：US15920999
申请日：2018-03-14
Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
Inventor： John Magie Coffin , Michael S. Georgiadis , Jei Y. Chou
IPC: G01J3/453 , G01J3/02 , G01J3/06 , H02P25/034 , H02P8/00
Abstract: An embodiment of a ruggedized interferometer is described that comprises a light source that generates a beam of light; a fixed mirror; a moving mirror that travels along a linear path; a beam splitter that directs a first portion of the beam of light to the fixed mirror and a second portion of the beam of light to the moving mirror, wherein the beam splitter recombines the first portion reflected from the fixed mirror and the second portion reflected from the moving mirror; and a servo control that applies a substantial degree of force to the moving mirror at initiation of a turnaround period, wherein the substantial degree of force is sufficient to redirect the moving mirror traveling at a high velocity to an opposite direction of travel on the linear path.
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