公开(公告)号：US12117488B1

公开(公告)日：2024-10-15

申请号：US18208886

申请日：2023-06-13

Applicant: Synopsys, Inc.

Inventor： Peter Wohl ,  John Arthur Waicukauski

IPC: G01R31/317 ,  G01R31/3177 ,  G01R31/3183 ,  G01R31/3187

CPC classification number: G01R31/31724 ,  G01R31/31727 ,  G01R31/3177 ,  G01R31/318307 ,  G01R31/3187

Abstract: A system and method are provided for testing logic using a logic built in self-test (LBIST) system, and in particular where the LBIST system tolerates unknown inputs (Xs) to the logic cells forming an XLBIST system. The system allows for providing multiple test system clocks from the LBIST system to the logic during a system clock capture cycle of a system clock during testing of the logic, wherein the system clock is separate from the multiple test system clocks of the LBIST system. Further, timing of an application of clock cycles of the multiple test system clocks of the LBIST system is controlled and provided to the logic during the system clock capture cycle.