公开(公告)号：US11322795B2

公开(公告)日：2022-05-03

申请号：US16835481

申请日：2020-03-31

申请人： Sumitomo Chemical Company, Limited

发明人： Yoshitaka Shinomiya ,  Koji Kashu ,  Yasuyuki Kondo

IPC分类号： H01M50/403 ,  G01N23/04 ,  B65H26/00 ,  B65H21/00 ,  H01M10/0525 ,  B65H18/28

摘要： To carry out accurate defect inspection over a wide area, a defect inspection device includes: a radiation source section configured to emit an electromagnetic wave to a separator roll; and a sensor section configured to detect the electromagnetic wave that the radiation source section has emitted to the separator roll, the sensor section being configured to detect the electromagnetic wave before and after the separator roll is moved relative to the radiation source section.

公开(公告)号：US10811652B2

公开(公告)日：2020-10-20

申请号：US15825264

申请日：2017-11-29

申请人： Sumitomo Chemical Company, Limited

发明人： Yoshitaka Shinomiya ,  Koji Kashu ,  Yasuyuki Kondo

IPC分类号： H01M2/14 ,  G01N23/04 ,  B65H26/00 ,  B65H21/00 ,  H01M10/0525 ,  B65H18/28

摘要： To carry out accurate defect inspection over a wide area, a defect inspection device (1) includes: a radiation source section (2) configured to emit an electromagnetic wave (4) to a separator roll (10); and a sensor section (3) configured to detect the electromagnetic wave (4) that the radiation source section (2) has emitted to the separator roll (10), the sensor section (3) being configured to detect the electromagnetic wave (4) before and after the separator roll is moved relative to the radiation source section (2).