公开(公告)号：US20240220376A1

公开(公告)日：2024-07-04

申请号：US18338001

申请日：2023-06-20

Applicant: Samsung Electronics Co., Ltd.

Inventor： Taewook HEO ,  Suckhyun NAM ,  Ho-Jin CHUN ,  Minha KIM

IPC: G06F11/14

CPC classification number: G06F11/1479

Abstract: Some example embodiments provide a storage device including a non-volatile memory; a microcontroller unit configured to monitor statuses of constituent elements of the storage device and output an abnormality signal based on the constituent elements not being in a normal status; and a storage controller configured to perform a first check and a second check different from the first check on a first firmware code stored in the microcontroller unit in response to the abnormality signal and perform recovery by using a second firmware code stored in the non-volatile memory based on at least one of the first check and the second check having failed.