公开(公告)号：US11971698B2

公开(公告)日：2024-04-30

申请号：US17248677

申请日：2021-02-02

Applicant: Samsung Electronics Co., Ltd.

Inventor： Aditya Jhawar ,  Aditi Jaiswal ,  Jaitirth Anthony Jacob ,  Nikhil Sahni ,  Hakryoul Kim ,  Jongwoo Kim ,  Sungyong Bang ,  Sunghun Jung ,  Suraj Jha ,  Vaisakh Punnekkattu Chirayil Sudheesh Babu ,  Renju Chirakarotu Nair

IPC: G05B19/406 ,  G06N3/08

CPC classification number: G05B19/406 ,  G06N3/08 ,  G05B2219/49217

Abstract: Methods and systems for ascertaining factors contributing to the temperature of a device. A method includes monitoring a plurality of parameters that are contributing to a temperature of the device. The method also includes estimating a degree of contribution of internal factors to the temperature of the device based on the monitored plurality of parameters and a battery temperature of a battery of the device. The method further includes estimating a degree of contribution of external factors to the temperature of the device, based on the monitored plurality of parameters and a battery temperature of a battery of the device. A neural network can be used for estimating the temperature of the ambience of the device and the impacts of internal and external factors on temperature of the device.