公开(公告)号：US12010177B2

公开(公告)日：2024-06-11

申请号：US17855705

申请日：2022-06-30

Applicant: Samsung Electronics Co., Ltd.

Inventor： Ilavarasu Jayabalan Ellan ,  Sunchit Sharma ,  Ariyalur Chandrasekaran Ganesh ,  Kishore Chandra Sahoo

IPC: H04L67/12 ,  G08B21/02 ,  G16Y20/10 ,  G16Y40/10

CPC classification number: H04L67/12 ,  G08B21/02 ,  G16Y20/10 ,  G16Y40/10

Abstract: The embodiment, herein disclose a method of handling critical events in IoT environment comprising a plurality of IoT devices and an at least one UWB sensor. The method comprises detecting an occurrence of an event using the UWB sensor; validating the event using at least one IoT device from the plurality of IoT devices located in vicinity of the event; determining a critical level of the event based on at least one of a presence of a user or a device data of the at least one IoT device located in a vicinity of the event; generating an action recommendation for the at least one of the user or the at least one IoT device based on the criticality level of the event.