公开(公告)号：US11709196B2

公开(公告)日：2023-07-25

申请号：US17378592

申请日：2021-07-16

Applicant: Samsung Electronics Co., Ltd.

Inventor： Donggyu Minn ,  Daehyun Kang ,  Yonghoon Kim ,  Jihoon Kim ,  Hyundo Ryu ,  Jeeho Park ,  Sunggi Yang ,  Youngchang Yoon ,  Sehyug Jeon

IPC: G01R31/28 ,  G01R31/3167 ,  G01R27/32

CPC classification number: G01R31/2822 ,  G01R27/32 ,  G01R31/3167

Abstract: The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.