Integrated circuit devices with crack-resistant fuse structures
    1.
    发明授权
    Integrated circuit devices with crack-resistant fuse structures 有权
    具有抗裂熔断结构的集成电路器件

    公开(公告)号:US08569862B2

    公开(公告)日:2013-10-29

    申请号:US13792996

    申请日:2013-03-11

    CPC classification number: H01L23/5258 H01L2924/0002 H01L2924/00

    Abstract: A fuse base insulating region, for example, an insulating interlayer or a compensation region disposed in an insulating interlayer, is formed on a substrate. An etch stop layer is formed on the fuse base insulating region and forming an insulating interlayer having a lower dielectric constant than the first fuse base insulating region on the etch stop layer. A trench extending through the insulating interlayer and the etch stop layer and at least partially into the fuse base insulating region is formed. A fuse is formed in the trench. The fuse base insulating region may have a greater mechanical strength and/or density than the second insulating interlayer.

    Abstract translation: 在衬底上形成熔丝基底绝缘区域,例如绝缘中间层或设置在绝缘中间层中的补偿区域。 在熔丝基底绝缘区上形成蚀刻停止层,形成绝缘中间层,该绝缘中间层的介电常数比蚀刻停止层上的第一熔丝基底绝缘区低。 形成了延伸穿过绝缘中间层和蚀刻停止层并且至少部分地进入熔丝基底绝缘区域的沟槽。 在沟槽中形成熔丝。 保险丝座绝缘区域可具有比第二绝缘中间层更大的机械强度和/或密度。

    INTEGRATED CIRCUIT DEVICES WITH CRACK-RESISTANT FUSE STRUCTURES
    2.
    发明申请
    INTEGRATED CIRCUIT DEVICES WITH CRACK-RESISTANT FUSE STRUCTURES 有权
    集成电路设备,具有抗电弧保险丝结构

    公开(公告)号:US20130193552A1

    公开(公告)日:2013-08-01

    申请号:US13792996

    申请日:2013-03-11

    CPC classification number: H01L23/5258 H01L2924/0002 H01L2924/00

    Abstract: A fuse base insulating region, for example, an insulating interlayer or a compensation region disposed in an insulating interlayer, is formed on a substrate. An etch stop layer is formed on the fuse base insulating region and forming an insulating interlayer having a lower dielectric constant than the first fuse base insulating region on the etch stop layer. A trench extending through the insulating interlayer and the etch stop layer and at least partially into the fuse base insulating region is formed. A fuse is formed in the trench. The fuse base insulating region may have a greater mechanical strength and/or density than the second insulating interlayer.

    Abstract translation: 在衬底上形成熔丝基底绝缘区域,例如绝缘中间层或设置在绝缘中间层中的补偿区域。 在熔丝基底绝缘区上形成蚀刻停止层,形成绝缘中间层,该绝缘中间层的介电常数比蚀刻停止层上的第一熔丝基底绝缘区低。 形成了延伸穿过绝缘中间层和蚀刻停止层并且至少部分地进入熔丝基底绝缘区域的沟槽。 在沟槽中形成熔丝。 保险丝座绝缘区域可具有比第二绝缘中间层更大的机械强度和/或密度。

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