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    Systems and methods for predicting storage device failure using machine learning
    1.
    发明授权
    Systems and methods for predicting storage device failure using machine learning 有权

    公开(公告)号：US12260347B2

    公开(公告)日：2025-03-25

    申请号：US18197717

    申请日：2023-05-15

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Qinling Zheng ,  Nima Elyasi ,  Vikas Sinha ,  Changho Choi

    IPC: G06N5/04 ,  G06F11/16 ,  G06N20/00

    Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.

    Active disturbance rejection based thermal control
    2.
    发明授权
    Active disturbance rejection based thermal control 有权

    公开(公告)号：US10809780B2

    公开(公告)日：2020-10-20

    申请号：US15961782

    申请日：2018-04-24

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Zhan Ping ,  Qinling Zheng

    IPC: G06F1/20 ,  G05D23/19 ,  G05B13/02 ,  G06F1/3234 ,  G06F3/06 ,  H05K7/20

    Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.

    Systems and methods for predicting storage device failure using machine learning
    4.
    发明授权
    Systems and methods for predicting storage device failure using machine learning 有权

    公开(公告)号：US11657300B2

    公开(公告)日：2023-05-23

    申请号：US15931573

    申请日：2020-05-13

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Qinling Zheng ,  Nima Elyasi ,  Vikas Sinha ,  Changho Choi

    IPC: G06N5/04 ,  G06N20/00 ,  G06F11/16

    CPC classification number: G06N5/04 ,  G06F11/16 ,  G06N20/00

    Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.

    Active disturbance rejection based thermal control
    5.
    发明授权
    Active disturbance rejection based thermal control 有权

    公开(公告)号：US12197259B2

    公开(公告)日：2025-01-14

    申请号：US18213704

    申请日：2023-06-23

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Zhan Ping ,  Qinling Zheng

    IPC: G06F1/20 ,  G05B13/02 ,  G05D23/19 ,  G06F1/3234 ,  G06F3/06 ,  H05K7/20

    Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.

    SYSTEMS AND METHODS FOR LATENCY-AWARE EDGE COMPUTING
    7.
    发明申请
    SYSTEMS AND METHODS FOR LATENCY-AWARE EDGE COMPUTING 审中-公开

    公开(公告)号：US20200267053A1

    公开(公告)日：2020-08-20

    申请号：US16790582

    申请日：2020-02-13

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Qinling Zheng ,  Ehsan Najafabadi ,  Yasser Zaghloul

    IPC: H04L12/24 ,  G06N3/04 ,  H04L12/26 ,  H04L12/833 ,  H04L29/08 ,  G06F9/455

    Abstract: Provided are systems, methods, and apparatuses for latency-aware edge computing to optimize network traffic. A method can include: determining network parameters associated with a network architecture, the network architecture comprising a data center and an edge data center; determining, using the network parameters, a first programmatically expected latency associated with the data center and a second programmatically expected latency associated with the edge data center; and determining, based at least in part on a difference between the first programmatically expected latency or the second programmatically expected latency, a distribution of a workload to be routed between the data center and the edge data center.

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