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公开(公告)号:US11037806B2
公开(公告)日:2021-06-15
申请号:US16509815
申请日:2019-07-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Seung-Yoon Song , Chan-Hoon Park , Jong-Woo Sun , Jung-Mo Sung , Je-Woo Han , Jin-Young Park
IPC: H01L21/67 , H01J37/32 , H01L21/762 , H01L21/308 , H01L21/3065
Abstract: In a plasma processing method, a substrate is loaded onto a lower electrode within a chamber. A plasma power is applied to form plasma within the chamber. A voltage function of a nonsinusoidal wave having a DC pulse portion and a ramp portion is generated. Generating the voltage function may include setting a slope of the ramp portion and setting a duration ratio of the ramp portion to a cycle of the voltage function in order to control an ion energy distribution generated at a surface of the substrate. A bias power of the nonsinusoidal wave is applied to the lower electrode.
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2.
公开(公告)号:US10790122B2
公开(公告)日:2020-09-29
申请号:US15907328
申请日:2018-02-28
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jung-Pyo Hong , Jong-Woo Sun , Jung-Mo Sung
IPC: H01J37/32 , H01L21/67 , H01L21/683
Abstract: A plasma processing apparatus includes a process chamber having an inner space, an electrostatic chuck in the process chamber and to which a substrate is mounted, a gas injection unit to inject a process gas into the process chamber at a side of the process chamber, a plasma applying unit to transform the process gas injected into the process chamber into plasma, and a plasma adjusting unit disposed around the electrostatic chuck and operative to adjust the density of the plasma across the substrate.
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3.
公开(公告)号:US20200227289A1
公开(公告)日:2020-07-16
申请号:US16509815
申请日:2019-07-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Seung-Yoon Song , Chan-Hoon Park , Jong-Woo Sun , Jung-Mo Sung , Je-Woo Han , Jin-Young Park
Abstract: In a plasma processing method, a substrate is loaded onto a lower electrode within a chamber. A plasma power is applied to form plasma within the chamber. A voltage function of a nonsinusoidal wave having a DC pulse portion and a ramp portion is generated. Generating the voltage function may include setting a slope of the ramp portion and setting a duration ratio of the ramp portion to a cycle of the voltage function in order to control an ion energy distribution generated at a surface of the substrate. A bias power of the nonsinusoidal wave is applied to the lower electrode.
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公开(公告)号:US11521866B2
公开(公告)日:2022-12-06
申请号:US17198938
申请日:2021-03-11
Applicant: Samsung Electronics Co., Ltd.
Inventor: Seung-Yoon Song , Chan-Hoon Park , Jong-Woo Sun , Jung-Mo Sung , Je-Woo Han , Jin-Young Park
IPC: H01L21/67 , H01J37/32 , H01L21/762 , H01L21/308 , H01L21/3065
Abstract: In a plasma processing method, a substrate is loaded onto a lower electrode within a chamber. A plasma power is applied to form plasma within the chamber. A voltage function of a nonsinusoidal wave having a DC pulse portion and a ramp portion is generated. Generating the voltage function may include setting a slope of the ramp portion and setting a duration ratio of the ramp portion to a cycle of the voltage function in order to control an ion energy distribution generated at a surface of the substrate. A bias power of the nonsinusoidal wave is applied to the lower electrode.
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5.
公开(公告)号:US11437222B2
公开(公告)日:2022-09-06
申请号:US17003479
申请日:2020-08-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jung-Pyo Hong , Jong-Woo Sun , Jung-Mo Sung
IPC: H01J37/32 , H01L21/67 , H01L21/683
Abstract: A plasma processing apparatus includes a process chamber having an inner space, an electrostatic chuck in the process chamber and to which a substrate is mounted, a gas injection unit to inject a process gas into the process chamber at a side of the process chamber, a plasma applying unit to transform the process gas injected into the process chamber into plasma, and a plasma adjusting unit disposed around the electrostatic chuck and operative to adjust the density of the plasma across the substrate.
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