公开(公告)号：US11378586B2

公开(公告)日：2022-07-05

申请号：US16778400

申请日：2020-01-31

Applicant: Samsung Electronics Co., Ltd.

Inventor： Joonsu Ji ,  Jinwoo Jung ,  Gyuyeol Kim ,  Jaehyoung Park

IPC: G01R31/28 ,  G01R1/04 ,  H01R12/85

Abstract: A stiffener includes a first upper cover and a second upper cover, a first lateral side cover and a second lateral side cover, and a first longitudinal side cover and a second longitudinal side cover. The first and second upper covers extend in parallel with each other. The first and second lateral side covers are connected to separate, respective covers of the first and second upper covers, and facing each other. The first and second longitudinal side covers are each connected to the both first and second upper covers, the first and second longitudinal side covers facing each other. The first and second upper covers each include a separate plurality of upper elastic portions. Each upper elastic portion of each separate plurality of upper elastic portions has a vertical elasticity.

公开(公告)号：US11372024B2

公开(公告)日：2022-06-28

申请号：US17065135

申请日：2020-10-07

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Joonsu Ji ,  Jinwoo Jung ,  Taejun Kim ,  Serim Lee

IPC: G01R31/28 ,  G01R1/073

Abstract: A probe card test apparatus including an insulating substrate; a conductive pattern on the insulating substrate; and a plurality of device under test (DUT) units on the conductive pattern, wherein each of the DUT units includes a merged-probe opening, a probe opening, and a detector in parallel, and an isolator surrounding the merged-probe opening, the probe opening, and the detector.