METAL-OXIDE SEMICONDUCTOR THIN FILM TRANSISTORS AND METHODS OF MANUFACTURING THE SAME
    1.
    发明申请
    METAL-OXIDE SEMICONDUCTOR THIN FILM TRANSISTORS AND METHODS OF MANUFACTURING THE SAME 审中-公开
    金属氧化物半导体薄膜晶体管及其制造方法

    公开(公告)号:US20140239291A1

    公开(公告)日:2014-08-28

    申请号:US14062137

    申请日:2013-10-24

    CPC classification number: H01L29/66969 H01L29/78606 H01L29/7869

    Abstract: According to example embodiments a TFT includes: a substrate; a gate electrode on the substrate; a gate insulating layer on the gate electrode; a channel layer on the gate insulating layer, the channel layer including an indium-rich metal-oxide layer; a first electrode on one end of the channel layer; a second electrode on the other end of the channel layer; and a passivation layer on the channel layer between the first and second electrodes.

    Abstract translation: 根据示例性实施例,TFT包括:衬底; 基板上的栅电极; 栅电极上的栅极绝缘层; 栅极绝缘层上的沟道层,沟道层包括富铟金属氧化物层; 沟道层一端的第一电极; 沟道层另一端的第二电极; 以及在第一和第二电极之间的沟道层上的钝化层。

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