公开(公告)号：US20210172979A1

公开(公告)日：2021-06-10

申请号：US16943632

申请日：2020-07-30

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyeju Kim ,  Youngchul Lee ,  Jaecheong Lee

IPC: G01R1/44 ,  G01R31/28

Abstract: A test board and a test apparatus having the same are disclosed. The test board includes a base plate including a connector and a plurality of mounting areas in a matrix shape having a mounting row in a first direction and a mounting column in a second direction, a plurality of test units arranged on the mounting areas of the base plate and a test object is mounted in each of the mounting areas, and a fluid supplier disposed on the base plate and supplying a test fluid to each of the test units having a test temperature and a supplementary fluid to the test object to reduce a temperature difference between an actual temperature of the test object and the test temperature such that the actual temperature of the test objects is substantially below the test temperature.

公开(公告)号：US12056351B2

公开(公告)日：2024-08-06

申请号：US17884689

申请日：2022-08-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Hyeju Kim ,  Jeongeun Kim ,  Sunmi Yoo

IPC: G06F3/06

CPC classification number: G06F3/0604 ,  G06F3/0656 ,  G06F3/0659 ,  G06F3/0673

Abstract: A storage device includes a memory device storing a lower-level bitmap indicating whether or not logical sectors are invalid in a host, and an upper-level bitmap indicating whether or not logical groups each including consecutive logical sectors are invalid, and a controller that controls the memory device and including a log buffer. The controller may receive a trim command for one or more target logical sectors from the host and determine using the upper-level bitmap whether or not one or more target logical groups including the target logical sectors are invalid, store a trim log including address information of target logical sectors included in a target logical group that is not invalid in the log buffer and refrain from storing a trim log for target logical sectors included in a target logical group that is invalid, and invalidate the target logical sectors.

公开(公告)号：US20230152968A1

公开(公告)日：2023-05-18

申请号：US17884689

申请日：2022-08-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Hyeju Kim ,  Jeongeun Kim ,  Sunmi Yoo

IPC: G06F3/06

CPC classification number: G06F3/0604 ,  G06F3/0656 ,  G06F3/0659 ,  G06F3/0673

Abstract: A storage device includes a memory device storing a lower-level bitmap indicating whether or not logical sectors are invalid in a host, and an upper-level bitmap indicating whether or not logical groups each including consecutive logical sectors are invalid, and a controller that controls the memory device and including a log buffer. The controller may receive a trim command for one or more target logical sectors from the host and determine using the upper-level bitmap whether or not one or more target logical groups including the target logical sectors are invalid, store a trim log including address information of target logical sectors included in a target logical group that is not invalid in the log buffer and refrain from storing a trim log for target logical sectors included in a target logical group that is invalid, and invalidate the target logical sectors.

公开(公告)号：US11422158B2

公开(公告)日：2022-08-23

申请号：US16943632

申请日：2020-07-30

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyeju Kim ,  Youngchul Lee ,  Jaecheong Lee

IPC: G01R1/44 ,  G01R31/28

Abstract: A test board and a test apparatus having the same are disclosed. The test board includes a base plate including a connector and a plurality of mounting areas in a matrix shape having a mounting row in a first direction and a mounting column in a second direction, a plurality of test units arranged on the mounting areas of the base plate and a test object is mounted in each of the mounting areas, and a fluid supplier disposed on the base plate and supplying a test fluid to each of the test units having a test temperature and a supplementary fluid to the test object to reduce a temperature difference between an actual temperature of the test object and the test temperature such that the actual temperature of the test objects is substantially below the test temperature.