公开(公告)号：US20230333160A1

公开(公告)日：2023-10-19

申请号：US18075542

申请日：2022-12-06

Applicant: Samsung Electronics Co., Ltd.

Inventor： BYUNG-SUNG KIM ,  YUN-HYOK CHOI ,  GYUYEOL KIM ,  SUNGJUNG KIM ,  CHEOL-HEUI PARK ,  SANGHOON LEE ,  JAE-WOONG CHOI

IPC: G01R31/3177 ,  G04F10/00

CPC classification number: G01R31/3177 ,  G04F10/005

Abstract: Disclosed is a fan-out buffer which includes a first channel that includes a first delay circuit adjusting a first delay time of a calibration test signal depending on a first delay control signal, a second channel that includes a second delay circuit adjusting a second delay time of the calibration test signal depending on a second delay control signal, a first edge-to-pulse converter that detects a first edge included in a first time domain reflectometry (TDR) waveform of an output terminal of the first channel and generates a first start pulse signal including a first pulse, a second edge-to-pulse converter that generates a second start pulse signal including a second pulse, a stop pulse signal generator that generates a stop pulse signal including a first stop pulse, and a first delay control signal generator that calculates a phase difference generates the first delay control signal.

公开(公告)号：US20220308088A1

公开(公告)日：2022-09-29

申请号：US17524841

申请日：2021-11-12

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： SUNG HOON LEE ,  GYUYEOL KIM ,  YU-KYUM KIM ,  HANJIK NAM ,  SEHOON PARK ,  YOUNG JUN PARK ,  SEUNGWON JEONG ,  WOOJUN CHOI

IPC: G01R1/073 ,  G01R1/067

Abstract: A probe for testing a semiconductor device includes a post having a plate shape and connected to a test substrate. A beam has a first end connected to the post. A tip structure is connected to a second end of the beam. The post includes a front surface having a normal line extending in a first direction. A back surface is located opposite to the front surface. Bumps are disposed on the front surface and are spaced apart from each other. The beam extends in a second direction intersecting the first direction. Each of the bumps protrudes from the front surface in the first direction by a first length.