公开(公告)号：US10371577B2

公开(公告)日：2019-08-06

申请号：US15092057

申请日：2016-04-06

Applicant: Samsung Electronics Co., LTD.

Inventor： Tae-Han Jeon ,  Hongsig Kim ,  Hyungrock Jung ,  Kyungseok Kim ,  Jungkeun Park ,  Taegun Park ,  Cheolho Cheong

IPC: G01J5/00 ,  G01J5/02 ,  G01J5/08

Abstract: An apparatus and method for measuring a temperature in an electronic device. An amount of light of an optical signal reflected off of an object is measured, and a size of a temperature measurement expectation area on the object based is determined based on the measured amount of light. A temperature measurement guide message is output based on a result of comparing the determined size and a reference area.