公开(公告)号：US20170038427A1

公开(公告)日：2017-02-09

申请号：US15017742

申请日：2016-02-08

Applicant: Samsung Display Co. Ltd.

Inventor： Joon Geol KIM ,  Si Joon KIM ,  Hee Seon KIM

IPC: G01R31/26 ,  H01L27/32

CPC classification number: H01L27/3244 ,  G09G3/006 ,  G09G3/3233 ,  G09G2300/0819 ,  G09G2300/0842 ,  G09G2300/0861 ,  G09G2330/10

Abstract: An array test apparatus includes a signal transmission unit which transmits a data signal to each of a plurality of data lines of a low-temperature polysilicon (“LTPS”) substrate, a signal measurement unit which measures the data signal of each of the data lines of the LTPS substrate, a timer which generates a horizontal period for setting a section in which the data signal is transmitted from the signal transmission unit to each of the data lines and a section in which the data signal output from each of the data lines is measured by the signal measurement unit, and a determination unit which determines whether each of the data lines of the LTPS substrate is normal based on the data signal measured by the signal measurement unit.

Abstract translation: 阵列测试装置包括：将数据信号发送到低温多晶硅（“LTPS”）基板的多条数据线中的每条数据线的信号传输单元，测量每条数据线的数据信号的信号测量单元 的定时器，产生用于设置数据信号从信号发送单元发送到每条数据线的部分的水平周期的定时器以及从每个数据线输出的数据信号的部分是 由信号测量单元测量的确定单元，以及确定单元，其基于由信号测量单元测量的数据信号来确定LTPS基板的每条数据线是否正常。