CONNECTION SUBSTRATE AND DISPLAY DEVICE INCLUDING THE SAME AND PAD CONTACT RESISTANCE MEASUREMENT METHOD

    公开(公告)号:US20200267837A1

    公开(公告)日:2020-08-20

    申请号:US16682282

    申请日:2019-11-13

    Abstract: A connection substrate includes a first substrate including first and second upper pads, and an inner wire electrically connecting the first and second upper pads, and a second substrate including first and second lower pads connected to the first and second upper pads, respectively. The second substrate includes a first test point disposed at an end of a first test wire extending from the first lower pad, a second test point disposed at an end of a second test wire extending from the second lower pad, and a dummy test point disposed at an end of a dummy test wire branched from a predetermined position of the second test wire and extended. A length of the dummy test wire is determined such that a resistance value of the dummy test wire is equal to a resistance value of the first test wire.

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