公开(公告)号：US09739697B2

公开(公告)日：2017-08-22

申请号：US14657197

申请日：2015-03-13

Applicant: Samsung Display Co., Ltd.

Inventor： Jong-Nam Lee ,  Ikjun Hong ,  Minsu Kim

IPC: G01N3/303

CPC classification number: G01N3/303

Abstract: A drop impact tester comprises a holder configured to hold a test piece and release the test piece such that the test piece drops in freefall; an impact surface disposed under the holder such that the test piece dropped from the holder hits the impact surface; and a drop angle measurement device configured to measure a drop angle which is a value correlated with an angle between a major surface of the dropped test piece and a reference plane. The tester further comprises an impact measurement device configured to move the impact surface from its first posing state to its second posing state to adjust an angle of the impact surface with respect to the reference plane based on the drop angle. The impact measurement device is configured to measure a drop impact applied to the impact surface by the dropped test piece or another test piece.

公开(公告)号：US20160047725A1

公开(公告)日：2016-02-18

申请号：US14657197

申请日：2015-03-13

Applicant: Samsung Display Co., Ltd.

Inventor： Jong-Nam Lee ,  Ikjun Hong ,  Minsu Kim

IPC: G01N3/303

CPC classification number: G01N3/303

Abstract: A drop impact tester comprises a holder configured to hold a test piece and release the test piece such that the test piece drops in freefall; an impact surface disposed under the holder such that the test piece dropped from the holder hits the impact surface; and a drop angle measurement device configured to measure a drop angle which is a value correlated with an angle between a major surface of the dropped test piece and a reference plane. The tester further comprises an impact measurement device configured to move the impact surface from its first posing state to its second posing state to adjust an angle of the impact surface with respect to the reference plane based on the drop angle. The impact measurement device is configured to measure a drop impact applied to the impact surface by the dropped test piece or another test piece.

Abstract translation: 跌落冲击试验机包括：保持器，其构造成保持试件并释放试样，使试件自由落体; 设置在所述保持器下方的冲击面，使得从所述保持件落下的所述试件撞击所述冲击面; 以及落下角测量装置，被配置为测量与下落的测试片的主表面与参考平面之间的角度相关的值的下落角度。 该测试器还包括冲击测量装置，该冲击测量装置被构造成将冲击表面从其第一摆动状态移动到其第二摆动状态，以基于下降角来调整冲击表面相对于参考平面的角度。 冲击测量装置被配置为测量由落下的试验片或另一试验片施加到冲击表面的下落冲击。