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公开(公告)号:US11957005B2
公开(公告)日:2024-04-09
申请号:US16937412
申请日:2020-07-23
Applicant: Samsung Display Co., Ltd.
Inventor: Seo Won Choe , Ki Wook Kim , Yang Wan Kim , Hyun Woong Kim , Eun Byul Jo
IPC: G09G3/32 , G09G3/3266 , H10K59/121 , H10K59/126 , H10K59/131 , H10K59/40 , G06F3/044
CPC classification number: H10K59/131 , G09G3/3266 , H10K59/1216 , H10K59/126 , H10K59/40 , G06F3/0446
Abstract: A display device includes: a substrate; scan lines extending in a first direction, and arranged along a second direction crossing the first direction on the substrate; data lines extending in the second direction, and arranged along the first direction on the substrate; a display area including pixels connected to the scan lines and the data lines; and a non-display area around the display area, and including compensation capacitors connected to some scan lines from among the scan lines. A sum of a capacitance of q odd scan lines or q even scan lines that are adjacent to each other from among the scan lines increases in the second direction, where q is a positive integer.
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公开(公告)号:US12268060B2
公开(公告)日:2025-04-01
申请号:US17400274
申请日:2021-08-12
Applicant: Samsung Display Co., LTD.
Inventor: Yoon Ho Kim , Jong Woo Park , June Hwan Kim , Tae Young Kim , Ki Ju Im , Eun Byul Jo
IPC: H10K59/126 , H01L29/66 , H01L29/786 , H10K59/12 , H10K59/124
Abstract: A display device includes a substrate, a first semiconductor layer on the substrate and including an oxide semiconductor, a first gate insulating film on the first semiconductor layer, a first conductive layer on the first gate insulating film, a first interlayer insulating film on the first conductive layer, and a second conductive layer on the first interlayer insulating film and connected to the first semiconductor layer through a through-hole. The through-hole includes a first through-hole passing through the first interlayer insulating film, and a second through-hole overlapping the first through-hole and passing through the first semiconductor layer. The second conductive layer is in contact with a side surface of the first semiconductor layer exposed at the second through-hole.
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