公开(公告)号：US09852018B2

公开(公告)日：2017-12-26

申请号：US13955091

申请日：2013-07-31

Applicant: Samsung Display Co., Ltd.

Inventor： Myoung-Ho Kwon ,  Chang-Jin Lee ,  Chang-Kil Lee ,  Tae-Sik Kim

IPC: G06F11/07 ,  G09G3/00 ,  G09G3/3208 ,  G09G5/06

CPC classification number: G06F11/0763 ,  G06F11/0736 ,  G09G3/006 ,  G09G3/3208 ,  G09G5/06 ,  G09G2320/0276 ,  G09G2330/12

Abstract: A method of detecting an error of a multi-time programmable (MTP) operation in which each gamma-offset and each header-bit at predetermined reference gray-levels are written in a MTP memory device while the MTP operation is performed on a pixel circuit, the each header-bit indicating whether or not the each gamma-offset is written in the MTP memory device, and it is detected whether or not the MTP operation is performed on the pixel circuit based on a logical operation between the header-bits at the predetermined reference gray-levels read from the MTP memory device when the MTP operation is finished on the pixel circuit.