公开(公告)号：US20140189444A1

公开(公告)日：2014-07-03

申请号：US13955091

申请日：2013-07-31

Applicant: Samsung Display Co., Ltd

Inventor： Myoung-Ho KWON ,  Chang-Jin LEE ,  Chang-Kil LEE ,  Tae-Sik KIM

IPC: G06F11/07

CPC classification number: G06F11/0763 ,  G06F11/0736 ,  G09G3/006 ,  G09G3/3208 ,  G09G5/06 ,  G09G2320/0276 ,  G09G2330/12

Abstract: A method of detecting an error of a multi-time programmable (MTP) operation in which each gamma-offset and each header-bit at predetermined reference gray-levels are written in a MTP memory device while the MTP operation is performed on a pixel circuit, the each header-bit indicating whether or not the each gamma-offset is written in the MTP memory device, and it is detected whether or not the MTP operation is performed on the pixel circuit based on a logical operation between the header-bits at the predetermined reference gray-levels read from the MTP memory device when the MTP operation is finished on the pixel circuit.

Abstract translation: 一种检测多时间可编程（MTP）操作的错误的方法，其中在对像素电路执行MTP操作的同时，在MTP存储器件中写入每个伽玛偏移和预定参考灰度级的每个标题位 每个标题位指示每个伽玛偏移是否被写入MTP存储器件中，并且检测是否基于像素电路上的标题位之间的逻辑运算来执行MTP操作 当MTP操作在像素电路上完成时，从MTP存储器件读取的预定参考灰度级。