公开(公告)号：US11448550B2

公开(公告)日：2022-09-20

申请号：US17153678

申请日：2021-01-20

Applicant: Samsung Display Co., LTD.

Inventor： Dae Youn Cho ,  Eu Gene Kim ,  Ji Ho Moon ,  Jong Woo Park ,  Young Tae Choi

IPC: G01J1/42 ,  G09G3/3275

Abstract: An optical measurement device includes an optical sensor which measures an optical waveform of a reference object or a measurement object, a learner which receives a first optical waveform of the reference object from the optical sensor and learns frequency characteristics of the first optical waveform, a filter generator which analyzes the frequency characteristics of the first optical waveform and generates a frequency filter, a frequency modeling unit which receives a second optical waveform of the measurement object from the optical sensor and models frequency characteristics of the second optical waveform, and an optical characteristic detector which calculates an optical characteristic index of the second optical waveform based on an output value of the frequency modeling unit and the frequency filter.