公开(公告)号：US11219113B2

公开(公告)日：2022-01-04

申请号：US16964717

申请日：2019-01-23

Applicant: SMITHS HEIMANN SAS

Inventor： Guillaume Jegou ,  Christophe Mielot

IPC: H01J35/30 ,  H01J35/08 ,  H05G1/52 ,  H01J35/16

Abstract: An inspection radiation source is provided. The inspection radiation source includes an electron accelerator for generating an electron current, and a target for the electron current including a first part and a second part. This first part is configured to be at least partly exposed to the electron current on an impact area having a first width in a direction substantially perpendicular to the electron current, and inhibit propagation of the electron current. The second part has a second width in the direction substantially perpendicular to the electron current, the second width of the second part being smaller than the first width of the impact area, the second part being configured to be at least partly exposed to the electron current, and generate inspection radiation by emitting X-rays in response to being exposed to the electron current.