Three-dimensional atom microscope, three-dimensional observation method of atomic arrangemment, and stereoscopic measuring method of atomic arrangement
    1.
    发明申请
    Three-dimensional atom microscope, three-dimensional observation method of atomic arrangemment, and stereoscopic measuring method of atomic arrangement 失效
    三维原子显微镜,原子排列的三维观察方法和原子排列的立体测量方法

    公开(公告)号:US20020014589A1

    公开(公告)日:2002-02-07

    申请号:US09919870

    申请日:2001-08-02

    Inventor: Hiroshi Daimon

    CPC classification number: G01N23/227

    Abstract: Forward scattering peaks of photoelectrons having different angular momenta is generated by radiating to a sample two rays of circularly polarized light that differ in a rotary direction. Two images of photoelectron diffraction patterns are formed by two-dimensionally detecting the photoelectron diffraction patterns formed with the photoelectron forward scattering peaks. The observer can three-dimensionally observe the structure in an atomic arrangement by observing these photoelectron diffraction pattern images with his or hers right and left eyes, respectively.

    Abstract translation: 具有不同角动量的光电子的正向散射峰通过向旋转方向不同的两个圆偏振光线照射而产生。 通过二维检测由光电子前向散射峰形成的光电子衍射图来形成光电子衍射图案的两个图像。 观察者可以分别用他或她的右眼和左眼观察这些光电子衍射图像图像,以原子排列三维地观察结构。

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