公开(公告)号：US20230314349A1

公开(公告)日：2023-10-05

申请号：US18017001

申请日：2021-06-11

Applicant: SHANGHAI JIAOTONG UNIVERSITY

Inventor： Jiao ZHANG ,  Yang TANG ,  Ya ZHANG ,  Yue WU ,  Hui XING ,  Baode SUN ,  Yanfeng HAN ,  Yongbing DAI ,  Chaopeng FU ,  Qing DONG

IPC: G01N23/207 ,  G01T1/20 ,  G01N23/20033 ,  G01N23/223 ,  G01J5/061

CPC classification number: G01N23/2076 ,  G01T1/20187 ,  G01N23/20033 ,  G01N23/223 ,  G01J5/061 ,  G01J2005/0077

Abstract: A multi-physical field measurement device for a metal solidification process and a housing and a measurement method thereof are provided. The device includes: a sealed housing provided with a light-through hole; a heater provided inside the housing and located behind the light-through hole along an X-ray; a diffraction detector used for receiving the X-ray which penetrates through a sample sheet and is scattered; a CMOS camera located behind the heater along the X-ray (11) and used for receiving a visible light signal which penetrates through the sample sheet; a silicon drift X-ray detector located at one side of the X-ray and used for receiving a fluorescent signal sent by interaction between the X-ray and the sample piece sheet; and an infrared thermal imager located at the other side of the X-ray and used for receiving an infrared signal sent by the sample sheet.