公开(公告)号：US20230162368A1

公开(公告)日：2023-05-25

申请号：US17992296

申请日：2022-11-22

Applicant: SAMSUNG ELECTRONICS CO.,LTD.

Inventor： Srenivas VARADARAJAN ,  Kaustav Chanda ,  Kwanghyuk Bae ,  Manish Goel

IPC: G06T7/12 ,  G01S17/894 ,  G06T17/00 ,  G06T7/521

CPC classification number: G06T7/12 ,  G01S17/894 ,  G06T17/00 ,  G06T7/521 ,  G06T2207/20021 ,  G06T2200/08 ,  G06T2207/20068 ,  G06T2207/10028

Abstract: A method for optimizing sampling in a spot Time-of-Flight (ToF) sensor includes receiving an image of a scene, dividing the image into plural rectangular regions, based on an edge feature in the image, computing an edge region alignment for each rectangular region by analyzing a Histogram of oriented Gradients (HoG) distribution corresponding to the rectangular region, re-projecting ToF data on a Complementary Metal Oxide Semiconductor (CMOS) Image Sensor (CIS) image plane according to the edge region alignment, sampling one or more rectangular regions from among the plural rectangular regions by comparing a regional depth variance of each rectangular region with a threshold depth variance, and reconfiguring an illumination pattern for a spot ToF sensor image frame using the one or more rectangular regions that are sampled.