公开(公告)号：US20240373591A1

公开(公告)日：2024-11-07

申请号：US18648045

申请日：2024-04-26

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Daesung Moon ,  Jihyun Lee ,  Jaeryong Jung ,  Jaesun Cho ,  Yoonsang Jung ,  Youngjun Kim ,  Seonung Yeom ,  Yewon Lim ,  Sunil Hyun

IPC: H05K7/20 ,  H01J37/141 ,  H01J37/18 ,  H01J37/26

Abstract: A transmission electron microscope includes a specimen chamber, a heat exchange bridge extending outward from a side wall of the specimen chamber, and a heat exchange connector including a heat exchange tube provided around a first portion of the heat exchange bridge, and a housing sealing the first portion of the heat exchange bridge and the heat exchange tube from an outside of the heat exchange connector.