公开(公告)号：US20240211736A1

公开(公告)日：2024-06-27

申请号：US18542890

申请日：2023-12-18

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Minchul Park ,  Satbyul Kim ,  Seongryeol Kim ,  Younggu Kim ,  Yeji Kim ,  Hyunjae Jang ,  In Huh

IPC: G06N3/0464 ,  G06F11/00 ,  G06N3/08

CPC classification number: G06N3/0464 ,  G06F11/004 ,  G06N3/08 ,  G06F2201/86

Abstract: Provided are an apparatus and a method of inferring semiconductor measurement results. The method of inferring semiconductor measurement results is based on artificial intelligence techniques and includes receiving layout data representing a layout of a semiconductor, generating a plurality of partial layouts based on the layout data, selecting a representative partial layout among the plurality of partial layouts, and generating, using a machine learning model, a predicted measurement result for the semiconductor based on the representative partial layout.

公开(公告)号：US11360752B2

公开(公告)日：2022-06-14

申请号：US17173868

申请日：2021-02-11

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sungbae Yoo ,  Seolheui Kim ,  Yeji Kim ,  Taesoo Kim ,  Jinbum Park

IPC: G06F8/41

Abstract: An electronic device includes a memory storing one or more instructions, and at least one processor configured to execute the one or more instructions to identify whether an annotation binding a first type object and a second type object is declared, and bind the first type object and the second type object, and sign both the bound first type object and the bound second type object based on identifying that the annotation is declared.