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1.
公开(公告)号:US20190130059A1
公开(公告)日:2019-05-02
申请号:US16233422
申请日:2018-12-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: JONGWOOK JEON , YEOIL YUN , SANGWOO PAE , UIHUI KWON , KEUNHO LEE
IPC: G06F17/50
Abstract: A method of designing a semiconductor circuit using a circuit simulation tool executed by a computer includes calculating power consumptions of elements of the semiconductor circuit by use of the circuit simulation tool. A thermal netlist is created about the semiconductor circuit, based on the power consumptions and geometry information of each of the elements. A simulation of the semiconductor circuit is performed with the thermal netlist using the circuit simulation tool to detect a temperature of each of the elements. The thermal netlist includes thermal capacitance information of each of the elements.
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2.
公开(公告)号:US20190294748A1
公开(公告)日:2019-09-26
申请号:US16280205
申请日:2019-02-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: JONGWOOK JEON , YEOIL YUN , SANGWOO PAE , UIHUI KWON , KEUNHO LEE
IPC: G06F17/50
Abstract: A method of designing a semiconductor circuit using a circuit simulation tool executed by a computer includes calculating power consumptions of elements of the semiconductor circuit by use of the circuit simulation tool. A thermal netlist is created about the semiconductor circuit, based on the power consumptions and geometry information of each of the elements. A simulation of the semiconductor circuit is performed with the thermal netlist using the circuit simulation tool to detect a temperature of each of the elements. The thermal netlist includes thermal capacitance information of each of the elements.
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